Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMV...
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| Veröffentlicht in: | Journal of sensors 2016-01, Vol.2016 (2016), p.1-6 |
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| container_title | Journal of sensors |
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| creator | Sheng, Jiangkun Huang, Shaoyan Yao, Zhibin Ma, Wuying He, Baoping Wang, Zujun Liu, Minbo |
| description | The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed. |
| doi_str_mv | 10.1155/2016/9604042 |
| format | Article |
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The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.</description><identifier>ISSN: 1687-725X</identifier><identifier>EISSN: 1687-7268</identifier><identifier>DOI: 10.1155/2016/9604042</identifier><language>eng</language><publisher>Cairo, Egypt: Hindawi Publishing Corporation</publisher><subject>Charge coupled devices ; Damage ; Dark current ; Degradation ; Experiments ; Laboratories ; Nonuniformity ; Radiation damage ; Saturation ; Signal processing</subject><ispartof>Journal of sensors, 2016-01, Vol.2016 (2016), p.1-6</ispartof><rights>Copyright © 2016 Zujun Wang et al.</rights><rights>Copyright © 2016 Zujun Wang et al. 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| subjects | Charge coupled devices Damage Dark current Degradation Experiments Laboratories Nonuniformity Radiation damage Saturation Signal processing |
| title | Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage |
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