Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System
SUMMARY Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative t...
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| Veröffentlicht in: | Electrical engineering in Japan 2016-11, Vol.197 (2), p.23-32 |
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| container_title | Electrical engineering in Japan |
| container_volume | 197 |
| creator | KIDA, JUNZO NAKAJIMA, MASATOSHI GODA, YUTAKA KIKUCHI, KUNIO KUDO, KIETSU ISHII, HIROMI MATSUI, YOSHIHIKO MATSUMURA, TOSHIRO KAWAMURA, TATSUO |
| description | SUMMARY
Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short‐Circuit Testing Committee (hereinafter referred to as “JSTC”) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010. |
| doi_str_mv | 10.1002/eej.22864 |
| format | Article |
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Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short‐Circuit Testing Committee (hereinafter referred to as “JSTC”) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010.</description><identifier>ISSN: 0424-7760</identifier><identifier>EISSN: 1520-6416</identifier><identifier>DOI: 10.1002/eej.22864</identifier><language>eng</language><publisher>Blackwell Publishing Ltd</publisher><subject>Bypasses ; Calibration ; comparison measurement ; Electric power generation ; High current ; reference measuring system ; Reference systems ; Resistors ; short-time alternating current ; shunt ; Shunts ; traceability ; uncertainty</subject><ispartof>Electrical engineering in Japan, 2016-11, Vol.197 (2), p.23-32</ispartof><rights>2016 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c3664-d36f875a94854697c9f79227dda701559cf6a307d0cd0077e8e79c82ebddef133</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Feej.22864$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Feej.22864$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27923,27924,45573,45574</link.rule.ids></links><search><creatorcontrib>KIDA, JUNZO</creatorcontrib><creatorcontrib>NAKAJIMA, MASATOSHI</creatorcontrib><creatorcontrib>GODA, YUTAKA</creatorcontrib><creatorcontrib>KIKUCHI, KUNIO</creatorcontrib><creatorcontrib>KUDO, KIETSU</creatorcontrib><creatorcontrib>ISHII, HIROMI</creatorcontrib><creatorcontrib>MATSUI, YOSHIHIKO</creatorcontrib><creatorcontrib>MATSUMURA, TOSHIRO</creatorcontrib><creatorcontrib>KAWAMURA, TATSUO</creatorcontrib><title>Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System</title><title>Electrical engineering in Japan</title><addtitle>Electr Eng Jpn</addtitle><description>SUMMARY
Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short‐Circuit Testing Committee (hereinafter referred to as “JSTC”) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010.</description><subject>Bypasses</subject><subject>Calibration</subject><subject>comparison measurement</subject><subject>Electric power generation</subject><subject>High current</subject><subject>reference measuring system</subject><subject>Reference systems</subject><subject>Resistors</subject><subject>short-time alternating current</subject><subject>shunt</subject><subject>Shunts</subject><subject>traceability</subject><subject>uncertainty</subject><issn>0424-7760</issn><issn>1520-6416</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp1kElPwzAQhS0EEmU58A9yhEOol8R2jqiUtRRBi5C4WCYel5QsxU6A_HtSAtw4zWj0vad5D6EDgo8JxnQIsDymVPJoAw1ITHHII8I30QBHNAqF4Hgb7Xi_xBgLIuQALU_hHfJqVUBZB5UN7sGCgzKFYPbSdCdbuW6rXB3OswKCk7wGV-o6KxfBRbZ4CUaNc2vpHHztA12aYFY3pl1b3YD2jVuTs9bXUOyhLatzD_s_cxc9nI3no4twcnt-OTqZhCnjPAoN41aKWCeRjCOeiDSxIqFUGKMFJnGcpJZrhoXBqelSCJAgklRSeDYGLGFsFx32vitXvTXdX6rIfAp5rkuoGq-IZDEnVGLcoUc9mrrKewdWrVxWaNcqgtW6T9X1qb777Nhhz35kObT_g2o8vvpVhL0i6-J__im0e1VcMBGrx-m5ktPrO8GeiGLsC3Mthj4</recordid><startdate>201611</startdate><enddate>201611</enddate><creator>KIDA, JUNZO</creator><creator>NAKAJIMA, MASATOSHI</creator><creator>GODA, YUTAKA</creator><creator>KIKUCHI, KUNIO</creator><creator>KUDO, KIETSU</creator><creator>ISHII, HIROMI</creator><creator>MATSUI, YOSHIHIKO</creator><creator>MATSUMURA, TOSHIRO</creator><creator>KAWAMURA, TATSUO</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>201611</creationdate><title>Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System</title><author>KIDA, JUNZO ; NAKAJIMA, MASATOSHI ; GODA, YUTAKA ; KIKUCHI, KUNIO ; KUDO, KIETSU ; ISHII, HIROMI ; MATSUI, YOSHIHIKO ; MATSUMURA, TOSHIRO ; KAWAMURA, TATSUO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3664-d36f875a94854697c9f79227dda701559cf6a307d0cd0077e8e79c82ebddef133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Bypasses</topic><topic>Calibration</topic><topic>comparison measurement</topic><topic>Electric power generation</topic><topic>High current</topic><topic>reference measuring system</topic><topic>Reference systems</topic><topic>Resistors</topic><topic>short-time alternating current</topic><topic>shunt</topic><topic>Shunts</topic><topic>traceability</topic><topic>uncertainty</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KIDA, JUNZO</creatorcontrib><creatorcontrib>NAKAJIMA, MASATOSHI</creatorcontrib><creatorcontrib>GODA, YUTAKA</creatorcontrib><creatorcontrib>KIKUCHI, KUNIO</creatorcontrib><creatorcontrib>KUDO, KIETSU</creatorcontrib><creatorcontrib>ISHII, HIROMI</creatorcontrib><creatorcontrib>MATSUI, YOSHIHIKO</creatorcontrib><creatorcontrib>MATSUMURA, TOSHIRO</creatorcontrib><creatorcontrib>KAWAMURA, TATSUO</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrical engineering in Japan</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KIDA, JUNZO</au><au>NAKAJIMA, MASATOSHI</au><au>GODA, YUTAKA</au><au>KIKUCHI, KUNIO</au><au>KUDO, KIETSU</au><au>ISHII, HIROMI</au><au>MATSUI, YOSHIHIKO</au><au>MATSUMURA, TOSHIRO</au><au>KAWAMURA, TATSUO</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System</atitle><jtitle>Electrical engineering in Japan</jtitle><addtitle>Electr Eng Jpn</addtitle><date>2016-11</date><risdate>2016</risdate><volume>197</volume><issue>2</issue><spage>23</spage><epage>32</epage><pages>23-32</pages><issn>0424-7760</issn><eissn>1520-6416</eissn><abstract>SUMMARY
Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short‐Circuit Testing Committee (hereinafter referred to as “JSTC”) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010.</abstract><pub>Blackwell Publishing Ltd</pub><doi>10.1002/eej.22864</doi><tpages>10</tpages></addata></record> |
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| ispartof | Electrical engineering in Japan, 2016-11, Vol.197 (2), p.23-32 |
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| language | eng |
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| source | Wiley Online Library Journals Frontfile Complete |
| subjects | Bypasses Calibration comparison measurement Electric power generation High current reference measuring system Reference systems Resistors short-time alternating current shunt Shunts traceability uncertainty |
| title | Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System |
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