Methods of phase reconstruction for time-averaging electronic speckle pattern interferometry
Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects. However, extending the process to achieve quantitative results requires unwrapping the phase in the interferogram, which contains significant noise due to t...
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| Veröffentlicht in: | Applied Optics 2016-03, Vol.55 (8), p.1913-1919 |
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| container_end_page | 1919 |
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| container_issue | 8 |
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| container_title | Applied Optics |
| container_volume | 55 |
| creator | Statsenko, T Chatziioannou, V Moore, T Kausel, W |
| description | Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects. However, extending the process to achieve quantitative results requires unwrapping the phase in the interferogram, which contains significant noise due to the speckle. Two methods to achieve accurate phase information from time-averaged speckle pattern interferograms are presented. The first is based on a direct inverse of the regions within corresponding phase intervals, and the second is based on optimization of four independent parameters. The optimization method requires less time than more commonly used algorithms and shows higher precision of the resulting surface displacement. |
| doi_str_mv | 10.1364/AO.55.001913 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0003-6935 |
| ispartof | Applied Optics, 2016-03, Vol.55 (8), p.1913-1919 |
| issn | 0003-6935 1559-128X 2155-3165 1539-4522 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1835605220 |
| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Algorithms Displacement Electronic speckle pattern interferometry Intervals Inverse Noise Optimization Speckle patterns |
| title | Methods of phase reconstruction for time-averaging electronic speckle pattern interferometry |
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