Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network

The RC ladder network has been analyzed for various catastrophic fault detection using minimal number of measurements. Generally, electronic circuit testing procedure is very exhaustive and includes higher cost; the presented approach will save fault diagnosis time. It is not possible to analyze the...

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Veröffentlicht in:Advances in power electronics 2016, Vol.2016, p.1-15
Hauptverfasser: Goel, Abhilasha Rani, Wajid, Mohd
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description The RC ladder network has been analyzed for various catastrophic fault detection using minimal number of measurements. Generally, electronic circuit testing procedure is very exhaustive and includes higher cost; the presented approach will save fault diagnosis time. It is not possible to analyze the big RC ladder network to give the good fault coverage, so the ladder network has been broken into segments of different sizes. However, if segment size is small, it will cause more area overhead compared to bigger step size in terms of the interconnections and pins on the integrated circuit. A systematic and detailed analysis for one-step, two-step, three-step, and four-step RC ladder networks has been carried out for various faults and optimal step size is proposed. It has been investigated that three measurements are optimal to localize different catastrophic faults in a RC ladder network.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1835569399</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1835569399</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3571-696a13e4e0dd030275be053069f167459ea0dcca4f82fc1126add1eacad4693f3</originalsourceid><addsrcrecordid>eNp90E1LwzAYB_AgCo65mx8g4EXQap6kSZuj1E2F6UAUvJWYpK6za2rSMvz2Zmx48GAuTw4_npc_QqdArgA4v6YExHUGmZA5HKARJZIkkNP88PcPb8doEsKKxMckF1KO0HTR9fVaNfjR9ktncOU8LlSvQu9dt6w1nqmh6QO-rdVH60IdcN3i5wLPlTHW4yfbb5z_PEFHlWqCnezrGL3Opi_FfTJf3D0UN_NEM55BIqRQwGxqiTGEEZrxd0s4I0JWILKUS6uI0VqlVU4rDUBFnAJWaWVSIVnFxuh817fz7muwoS_XddC2aVRr3RBKyBmPdzEpIz37Q1du8G3cLioiUkozmkd1uVPauxC8rcrOxzj8dwmk3MZabmMt97FGfrHjy7o1alP_r38AyYN05w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1806422728</pqid></control><display><type>article</type><title>Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network</title><source>Wiley-Blackwell Open Access Titles</source><source>Alma/SFX Local Collection</source><creator>Goel, Abhilasha Rani ; Wajid, Mohd</creator><contributor>Marques Cardoso, Antonio J.</contributor><creatorcontrib>Goel, Abhilasha Rani ; Wajid, Mohd ; Marques Cardoso, Antonio J.</creatorcontrib><description>The RC ladder network has been analyzed for various catastrophic fault detection using minimal number of measurements. Generally, electronic circuit testing procedure is very exhaustive and includes higher cost; the presented approach will save fault diagnosis time. It is not possible to analyze the big RC ladder network to give the good fault coverage, so the ladder network has been broken into segments of different sizes. However, if segment size is small, it will cause more area overhead compared to bigger step size in terms of the interconnections and pins on the integrated circuit. A systematic and detailed analysis for one-step, two-step, three-step, and four-step RC ladder networks has been carried out for various faults and optimal step size is proposed. It has been investigated that three measurements are optimal to localize different catastrophic faults in a RC ladder network.</description><identifier>ISSN: 2090-181X</identifier><identifier>EISSN: 2090-1828</identifier><identifier>DOI: 10.1155/2016/7176981</identifier><language>eng</language><publisher>New York: Hindawi Publishing Corporation</publisher><subject>Algorithms ; Cost engineering ; Defects ; Electronics ; Fault diagnosis ; Faults ; Integrated circuits ; Ladders ; Networks ; Optimization ; Segments</subject><ispartof>Advances in power electronics, 2016, Vol.2016, p.1-15</ispartof><rights>Copyright © 2016 Abhilasha Rani Goel and Mohd Wajid.</rights><rights>Copyright © 2016 Abhilasha Rani Goel and Mohd Wajid. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c3571-696a13e4e0dd030275be053069f167459ea0dcca4f82fc1126add1eacad4693f3</cites><orcidid>0000-0002-6932-6354 ; 0000-0002-7117-7546</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,4024,27923,27924,27925</link.rule.ids></links><search><contributor>Marques Cardoso, Antonio J.</contributor><creatorcontrib>Goel, Abhilasha Rani</creatorcontrib><creatorcontrib>Wajid, Mohd</creatorcontrib><title>Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network</title><title>Advances in power electronics</title><description>The RC ladder network has been analyzed for various catastrophic fault detection using minimal number of measurements. Generally, electronic circuit testing procedure is very exhaustive and includes higher cost; the presented approach will save fault diagnosis time. It is not possible to analyze the big RC ladder network to give the good fault coverage, so the ladder network has been broken into segments of different sizes. However, if segment size is small, it will cause more area overhead compared to bigger step size in terms of the interconnections and pins on the integrated circuit. A systematic and detailed analysis for one-step, two-step, three-step, and four-step RC ladder networks has been carried out for various faults and optimal step size is proposed. It has been investigated that three measurements are optimal to localize different catastrophic faults in a RC ladder network.</description><subject>Algorithms</subject><subject>Cost engineering</subject><subject>Defects</subject><subject>Electronics</subject><subject>Fault diagnosis</subject><subject>Faults</subject><subject>Integrated circuits</subject><subject>Ladders</subject><subject>Networks</subject><subject>Optimization</subject><subject>Segments</subject><issn>2090-181X</issn><issn>2090-1828</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RHX</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp90E1LwzAYB_AgCo65mx8g4EXQap6kSZuj1E2F6UAUvJWYpK6za2rSMvz2Zmx48GAuTw4_npc_QqdArgA4v6YExHUGmZA5HKARJZIkkNP88PcPb8doEsKKxMckF1KO0HTR9fVaNfjR9ktncOU8LlSvQu9dt6w1nqmh6QO-rdVH60IdcN3i5wLPlTHW4yfbb5z_PEFHlWqCnezrGL3Opi_FfTJf3D0UN_NEM55BIqRQwGxqiTGEEZrxd0s4I0JWILKUS6uI0VqlVU4rDUBFnAJWaWVSIVnFxuh817fz7muwoS_XddC2aVRr3RBKyBmPdzEpIz37Q1du8G3cLioiUkozmkd1uVPauxC8rcrOxzj8dwmk3MZabmMt97FGfrHjy7o1alP_r38AyYN05w</recordid><startdate>2016</startdate><enddate>2016</enddate><creator>Goel, Abhilasha Rani</creator><creator>Wajid, Mohd</creator><general>Hindawi Publishing Corporation</general><general>Hindawi Limited</general><scope>RHU</scope><scope>RHW</scope><scope>RHX</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>CWDGH</scope><scope>DWQXO</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><orcidid>https://orcid.org/0000-0002-6932-6354</orcidid><orcidid>https://orcid.org/0000-0002-7117-7546</orcidid></search><sort><creationdate>2016</creationdate><title>Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network</title><author>Goel, Abhilasha Rani ; Wajid, Mohd</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3571-696a13e4e0dd030275be053069f167459ea0dcca4f82fc1126add1eacad4693f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Algorithms</topic><topic>Cost engineering</topic><topic>Defects</topic><topic>Electronics</topic><topic>Fault diagnosis</topic><topic>Faults</topic><topic>Integrated circuits</topic><topic>Ladders</topic><topic>Networks</topic><topic>Optimization</topic><topic>Segments</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Goel, Abhilasha Rani</creatorcontrib><creatorcontrib>Wajid, Mohd</creatorcontrib><collection>Hindawi Publishing Complete</collection><collection>Hindawi Publishing Subscription Journals</collection><collection>Hindawi Publishing Open Access Journals</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>Middle East &amp; Africa Database</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Advances in power electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Goel, Abhilasha Rani</au><au>Wajid, Mohd</au><au>Marques Cardoso, Antonio J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network</atitle><jtitle>Advances in power electronics</jtitle><date>2016</date><risdate>2016</risdate><volume>2016</volume><spage>1</spage><epage>15</epage><pages>1-15</pages><issn>2090-181X</issn><eissn>2090-1828</eissn><abstract>The RC ladder network has been analyzed for various catastrophic fault detection using minimal number of measurements. Generally, electronic circuit testing procedure is very exhaustive and includes higher cost; the presented approach will save fault diagnosis time. It is not possible to analyze the big RC ladder network to give the good fault coverage, so the ladder network has been broken into segments of different sizes. However, if segment size is small, it will cause more area overhead compared to bigger step size in terms of the interconnections and pins on the integrated circuit. A systematic and detailed analysis for one-step, two-step, three-step, and four-step RC ladder networks has been carried out for various faults and optimal step size is proposed. It has been investigated that three measurements are optimal to localize different catastrophic faults in a RC ladder network.</abstract><cop>New York</cop><pub>Hindawi Publishing Corporation</pub><doi>10.1155/2016/7176981</doi><tpages>15</tpages><orcidid>https://orcid.org/0000-0002-6932-6354</orcidid><orcidid>https://orcid.org/0000-0002-7117-7546</orcidid><oa>free_for_read</oa></addata></record>
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source Wiley-Blackwell Open Access Titles; Alma/SFX Local Collection
subjects Algorithms
Cost engineering
Defects
Electronics
Fault diagnosis
Faults
Integrated circuits
Ladders
Networks
Optimization
Segments
title Optimal Method for Catastrophic Faults Diagnosis in RC Ladder Network
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T17%3A19%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optimal%20Method%20for%20Catastrophic%20Faults%20Diagnosis%20in%20RC%20Ladder%20Network&rft.jtitle=Advances%20in%20power%20electronics&rft.au=Goel,%20Abhilasha%20Rani&rft.date=2016&rft.volume=2016&rft.spage=1&rft.epage=15&rft.pages=1-15&rft.issn=2090-181X&rft.eissn=2090-1828&rft_id=info:doi/10.1155/2016/7176981&rft_dat=%3Cproquest_cross%3E1835569399%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1806422728&rft_id=info:pmid/&rfr_iscdi=true