Multi-Pinhole SPECT Imaging With Silicon Strip Detectors

Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging stud...

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Veröffentlicht in:IEEE transactions on nuclear science 2009-06, Vol.56 (3), p.646-652
Hauptverfasser: Peterson, T.E., Shokouhi, S., Furenlid, L.R., Wilson, D.W.
Format: Artikel
Sprache:eng
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Zusammenfassung:Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging studies using a prototype system that utilizes a detector of 300-micrometer thickness and 50-micrometer strip pitch together with a 23-pinhole collimator. These studies include an investigation of the synthetic-collimator imaging approach, which combines multiple-pinhole projections acquired at multiple magnifications to obtain tomographic reconstructions from limited-angle data using the ML-EM algorithm. Sub-millimeter spatial resolution was obtained, demonstrating the basic validity of this approach.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2009.2012514