SiC Power Switches Evaluation for Space Applications Requirements
We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target appli...
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Veröffentlicht in: | Materials Science Forum 2016-05, Vol.858, p.852-855 |
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creator | Godignon, Philippe Moreno, J. Lopez, D. Jordà, X. Soler, V. Massetti, Silvia Maset, E. |
description | We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target applications where SiC could be used as a technology push for a new generation of space electronics units. Silicon devices qualified for space systems above 600V for the switches and 1200V for the rectifiers are not available due to performances limitations of Si. Among the typical static and dynamic characterization, we have performed temperature and power stress and HTRB tests. More remarkably, we have carried out a first batch of total dose and heavy ions radiation experiments on 3 types of power switches: normally-on JFET, normally-off JFET and power MOSFET. Due to its higher stability and radiation hardness, the normally-on JFET is today the more adequate and reliable switch for the space applications. |
doi_str_mv | 10.4028/www.scientific.net/MSF.858.852 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1825514470</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1825514470</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3042-aa7dd315930827441388d14a28ff8f201535329722f998e6831a6ef6c9a9dde13</originalsourceid><addsrcrecordid>eNqNkN1LwzAUxYMf4Kb-DwVBfGmXj-ajL-IYmwoTxelzCGnCMrq2S1qL_73RCYpPPlwuHA7nnvsD4BLBLIdYTIZhyIJ2pu6cdTqrTTd5WC0yQUUcfABGiDGcFpziQzAmkFCOYI7xERhBTGlKc85OwDiEDYQECcRGYLpys-SpGYxPVoPr9NqEZP6mql51rqkT20S9Vdok07atnP5SQ_Jsdr3zZhuLhDNwbFUVzPn3PgWvi_nL7C5dPt7ez6bLVJPYIVWKlyVBtCBQYJ7niAhRolxhYa2wGCJKKMEFx9gWhTBMEKSYsUwXqihLg8gpuNrntr7Z9SZ0cuuCNlWlatP0QSIRX0R5zmG0Xvyxbpre17GdRLzADFLOeHRd713aNyF4Y2Xr3Vb5d4mg_MQtI275g1tG3DLilhF3HBwDbvYBnVd16Ixe_7rzv4gPLeONlg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1792605767</pqid></control><display><type>article</type><title>SiC Power Switches Evaluation for Space Applications Requirements</title><source>ProQuest Central Essentials</source><source>ProQuest Central (Alumni Edition)</source><source>ProQuest Central Student</source><source>Scientific.net Journals</source><creator>Godignon, Philippe ; Moreno, J. ; Lopez, D. ; Jordà, X. ; Soler, V. ; Massetti, Silvia ; Maset, E.</creator><creatorcontrib>Godignon, Philippe ; Moreno, J. ; Lopez, D. ; Jordà, X. ; Soler, V. ; Massetti, Silvia ; Maset, E.</creatorcontrib><description>We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target applications where SiC could be used as a technology push for a new generation of space electronics units. Silicon devices qualified for space systems above 600V for the switches and 1200V for the rectifiers are not available due to performances limitations of Si. Among the typical static and dynamic characterization, we have performed temperature and power stress and HTRB tests. More remarkably, we have carried out a first batch of total dose and heavy ions radiation experiments on 3 types of power switches: normally-on JFET, normally-off JFET and power MOSFET. Due to its higher stability and radiation hardness, the normally-on JFET is today the more adequate and reliable switch for the space applications.</description><identifier>ISSN: 0255-5476</identifier><identifier>ISSN: 1662-9752</identifier><identifier>ISBN: 3035710422</identifier><identifier>ISBN: 9783035710427</identifier><identifier>EISSN: 1662-9752</identifier><identifier>DOI: 10.4028/www.scientific.net/MSF.858.852</identifier><language>eng</language><publisher>Pfaffikon: Trans Tech Publications Ltd</publisher><subject>Dynamical systems ; Dynamics ; JFET ; MOSFETs ; Radiation hardness ; Silicon carbide ; Space applications ; Switches</subject><ispartof>Materials Science Forum, 2016-05, Vol.858, p.852-855</ispartof><rights>2016 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. May 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3042-aa7dd315930827441388d14a28ff8f201535329722f998e6831a6ef6c9a9dde13</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/3999?width=600</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/1792605767?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,780,784,21387,21388,23254,27922,27923,33528,33529,33701,33702,34312,34313,43657,43785,44065</link.rule.ids></links><search><creatorcontrib>Godignon, Philippe</creatorcontrib><creatorcontrib>Moreno, J.</creatorcontrib><creatorcontrib>Lopez, D.</creatorcontrib><creatorcontrib>Jordà, X.</creatorcontrib><creatorcontrib>Soler, V.</creatorcontrib><creatorcontrib>Massetti, Silvia</creatorcontrib><creatorcontrib>Maset, E.</creatorcontrib><title>SiC Power Switches Evaluation for Space Applications Requirements</title><title>Materials Science Forum</title><description>We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target applications where SiC could be used as a technology push for a new generation of space electronics units. Silicon devices qualified for space systems above 600V for the switches and 1200V for the rectifiers are not available due to performances limitations of Si. Among the typical static and dynamic characterization, we have performed temperature and power stress and HTRB tests. More remarkably, we have carried out a first batch of total dose and heavy ions radiation experiments on 3 types of power switches: normally-on JFET, normally-off JFET and power MOSFET. Due to its higher stability and radiation hardness, the normally-on JFET is today the more adequate and reliable switch for the space applications.</description><subject>Dynamical systems</subject><subject>Dynamics</subject><subject>JFET</subject><subject>MOSFETs</subject><subject>Radiation hardness</subject><subject>Silicon carbide</subject><subject>Space applications</subject><subject>Switches</subject><issn>0255-5476</issn><issn>1662-9752</issn><issn>1662-9752</issn><isbn>3035710422</isbn><isbn>9783035710427</isbn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNqNkN1LwzAUxYMf4Kb-DwVBfGmXj-ajL-IYmwoTxelzCGnCMrq2S1qL_73RCYpPPlwuHA7nnvsD4BLBLIdYTIZhyIJ2pu6cdTqrTTd5WC0yQUUcfABGiDGcFpziQzAmkFCOYI7xERhBTGlKc85OwDiEDYQECcRGYLpys-SpGYxPVoPr9NqEZP6mql51rqkT20S9Vdok07atnP5SQ_Jsdr3zZhuLhDNwbFUVzPn3PgWvi_nL7C5dPt7ez6bLVJPYIVWKlyVBtCBQYJ7niAhRolxhYa2wGCJKKMEFx9gWhTBMEKSYsUwXqihLg8gpuNrntr7Z9SZ0cuuCNlWlatP0QSIRX0R5zmG0Xvyxbpre17GdRLzADFLOeHRd713aNyF4Y2Xr3Vb5d4mg_MQtI275g1tG3DLilhF3HBwDbvYBnVd16Ixe_7rzv4gPLeONlg</recordid><startdate>20160524</startdate><enddate>20160524</enddate><creator>Godignon, Philippe</creator><creator>Moreno, J.</creator><creator>Lopez, D.</creator><creator>Jordà, X.</creator><creator>Soler, V.</creator><creator>Massetti, Silvia</creator><creator>Maset, E.</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7SR</scope><scope>7XB</scope><scope>88I</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>M2P</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>Q9U</scope></search><sort><creationdate>20160524</creationdate><title>SiC Power Switches Evaluation for Space Applications Requirements</title><author>Godignon, Philippe ; Moreno, J. ; Lopez, D. ; Jordà, X. ; Soler, V. ; Massetti, Silvia ; Maset, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3042-aa7dd315930827441388d14a28ff8f201535329722f998e6831a6ef6c9a9dde13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Dynamical systems</topic><topic>Dynamics</topic><topic>JFET</topic><topic>MOSFETs</topic><topic>Radiation hardness</topic><topic>Silicon carbide</topic><topic>Space applications</topic><topic>Switches</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Godignon, Philippe</creatorcontrib><creatorcontrib>Moreno, J.</creatorcontrib><creatorcontrib>Lopez, D.</creatorcontrib><creatorcontrib>Jordà, X.</creatorcontrib><creatorcontrib>Soler, V.</creatorcontrib><creatorcontrib>Massetti, Silvia</creatorcontrib><creatorcontrib>Maset, E.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Engineered Materials Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Science Database (ProQuest)</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>ProQuest Central Basic</collection><jtitle>Materials Science Forum</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Godignon, Philippe</au><au>Moreno, J.</au><au>Lopez, D.</au><au>Jordà, X.</au><au>Soler, V.</au><au>Massetti, Silvia</au><au>Maset, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>SiC Power Switches Evaluation for Space Applications Requirements</atitle><jtitle>Materials Science Forum</jtitle><date>2016-05-24</date><risdate>2016</risdate><volume>858</volume><spage>852</spage><epage>855</epage><pages>852-855</pages><issn>0255-5476</issn><issn>1662-9752</issn><eissn>1662-9752</eissn><isbn>3035710422</isbn><isbn>9783035710427</isbn><abstract>We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target applications where SiC could be used as a technology push for a new generation of space electronics units. Silicon devices qualified for space systems above 600V for the switches and 1200V for the rectifiers are not available due to performances limitations of Si. Among the typical static and dynamic characterization, we have performed temperature and power stress and HTRB tests. More remarkably, we have carried out a first batch of total dose and heavy ions radiation experiments on 3 types of power switches: normally-on JFET, normally-off JFET and power MOSFET. Due to its higher stability and radiation hardness, the normally-on JFET is today the more adequate and reliable switch for the space applications.</abstract><cop>Pfaffikon</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/MSF.858.852</doi><tpages>4</tpages></addata></record> |
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subjects | Dynamical systems Dynamics JFET MOSFETs Radiation hardness Silicon carbide Space applications Switches |
title | SiC Power Switches Evaluation for Space Applications Requirements |
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