An empirical method for imaging the short circuit current density in silicon solar cells based on dark lock-in thermography

The most straightforward way to map the photo-induced short circuit current density (Jsc) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for Jsc imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This let...

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Veröffentlicht in:	Solar energy materials and solar cells 2015-12, Vol.143, p.406-410
Hauptverfasser:	Breitenstein, Otwin, Fertig, Fabian, Bauer, Jan
Format:	Artikel
Sprache:	eng
Schlagworte:	2D device simulation Density Imaging Local analysis Lock-in thermography Photocurrent imaging Photovoltaic cells Quantitative evaluation Short circuit currents Solar cells Solar energy Thermal imaging Thermography
Online-Zugang:	Volltext
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