A multi-scale modeling framework for instabilities of film/substrate systems

Spatial pattern formation in stiff thin films on soft substrates is investigated from a multi-scale point of view based on a technique of slowly varying Fourier coefficients. A general macroscopic modeling framework is developed and then a simplified macroscopic model is derived. The model incorpora...

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Veröffentlicht in:Journal of the Mechanics and Physics of Solids 2016-01, Vol.86, p.150-172
Hauptverfasser: Xu, Fan, Potier-Ferry, Michel
Format: Artikel
Sprache:eng
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