Investigations on phase change characteristics of Ti-doped Ge sub(2)Sb sub(2)Te sub(5) system

Ab initio calculations and experiments are both adopted to study the effects of Ti dopant on the phase change characteristics of Ge sub(2)Sb sub(2)Te sub(5). The original and Ti-doped Ge sub(2)Sb sub(2)Te sub(5) films were deposited by magnetron sputtering. The optical and structural properties were...

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Veröffentlicht in:Journal of physics. D, Applied physics Applied physics, 2015-12, Vol.48 (47), p.475108-475114
Hauptverfasser: Cheng, Shuai, Wei, Shenjin, Yi, Xinyu, Wang, Jun, Liu, Chaochao, Li, Jing, Yang, Tieying
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container_end_page 475114
container_issue 47
container_start_page 475108
container_title Journal of physics. D, Applied physics
container_volume 48
creator Cheng, Shuai
Wei, Shenjin
Yi, Xinyu
Wang, Jun
Liu, Chaochao
Li, Jing
Yang, Tieying
description Ab initio calculations and experiments are both adopted to study the effects of Ti dopant on the phase change characteristics of Ge sub(2)Sb sub(2)Te sub(5). The original and Ti-doped Ge sub(2)Sb sub(2)Te sub(5) films were deposited by magnetron sputtering. The optical and structural properties were investigated by spectroscopic ellipsometry and grazing incidence diffraction methods. According to the calculation results of the density of states and optical band gap, the Ti-doped Ge sub(2)Sb sub(2)Te sub(5) has a less narrow band gap than the original one. A comparison of the theoretical and experimental results shows that Ti dopant restrains the phase transition from amorphous to cubic and eliminates that from cubic to hexagonal. Besides, the reflectivity of Ge sub(2)Sb sub(2)Te sub(5) decreases after doping the Ti element.
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subjects Diffraction
Dopants
Ellipsometry
Mathematical analysis
Optical properties
Phase change
Reflectivity
Titanium
title Investigations on phase change characteristics of Ti-doped Ge sub(2)Sb sub(2)Te sub(5) system
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