Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process

Charge sharing is becoming an important topic as the feature size scales down in fin field-effect-transistor （FinFET） technology. However, the studies of charge sharing induced single-event transient （SET） pulse quenching with bulk FinFET are reported seldomly. Using three-dimensional technology com...

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