Research on the development of illumination control system in machine vision measurement

Image measurement based on machine vision is a promising method for the precise measurements of workpiece. The measuring precision depends on a high quality image data. The lamp-house and illumination scheme affect the image quality and edge extracting effect directly. It will bring out the characte...

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Hauptverfasser:	Sifan, Qu, Hu, Zhou, Gaochao, Tan
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Computers Conferences Control systems Illumination Image quality Light emitting diodes Light sources Lighting Lighting control Machine vision Optical variables measurement Systems design Workpieces
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creator	Sifan, Qu Hu, Zhou Gaochao, Tan
description	Image measurement based on machine vision is a promising method for the precise measurements of workpiece. The measuring precision depends on a high quality image data. The lamp-house and illumination scheme affect the image quality and edge extracting effect directly. It will bring out the characteristics of the object as the system asked. In order to increase the contrast, they should make the difference of the object and the background evident. All of the above assure that the result of measurement is the best. This paper introduces an illumination control scheme which is applied in image measurement, including system configuration, lamp-house structure, control architecture, etc. Experiments show that, the effects of illumination control for image measurement are prominent with this method.
doi_str_mv	10.1109/ISDEA.2012.395
format	Conference Proceeding
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Computers Conferences Control systems Illumination Image quality Light emitting diodes Light sources Lighting Lighting control Machine vision Optical variables measurement Systems design Workpieces
title	Research on the development of illumination control system in machine vision measurement
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