Electrocatalysis-induced elasticity modulation in a superionic proton conductor probed by band-excitation atomic force microscopy
Variable temperature band-excitation atomic force microscopy in conjunction with I - V spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO 4 during proton exchange induced by a Pt-coated conductive scanning probe. At a sample temperature of 150 °C and under an appl...
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Veröffentlicht in: | Nanoscale 2015-12, Vol.7 (47), p.289-294 |
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creator | Papandrew, A. B Li, Q Okatan, M. B Jesse, S Hartnett, C Kalinin, S. V Vasudevan, R. K |
description | Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe. At a sample temperature of 150 °C and under an applied bias |
doi_str_mv | 10.1039/c5nr04809e |
format | Article |
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I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe. At a sample temperature of 150 °C and under an applied bias <1 V, reduction currents of up to 1 nA were observed. Simultaneously, we show that the electrochemical reactions are accompanied by a reversible decrease in the elastic modulus of CsHSO
4
, as seen by a contact resonance shift, and find evidence for superplasticity during scanning. These effects were not observed in the room-temperature phase of CsHSO
4
or in the case of catalytically inactive conductive probes, proving the utility of this technique for monitoring electrochemical processes on the nanoscale, as well as the use of local contact stiffness as a sensitive indicator of electrochemical reactions.
Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe.</description><identifier>ISSN: 2040-3364</identifier><identifier>EISSN: 2040-3372</identifier><identifier>DOI: 10.1039/c5nr04809e</identifier><identifier>PMID: 26568116</identifier><language>eng</language><publisher>England</publisher><subject>Atomic force microscopy ; Chemical reactions ; Conductors (devices) ; Contact ; Modulation ; Nanostructure ; Phase shift ; Scanning</subject><ispartof>Nanoscale, 2015-12, Vol.7 (47), p.289-294</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-ebcd807d80472fd015e0c3d003f1e6215d522b535d8ff2e3cfc7cc12e4aae8353</citedby><cites>FETCH-LOGICAL-c368t-ebcd807d80472fd015e0c3d003f1e6215d522b535d8ff2e3cfc7cc12e4aae8353</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,27929,27930</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/26568116$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Papandrew, A. B</creatorcontrib><creatorcontrib>Li, Q</creatorcontrib><creatorcontrib>Okatan, M. B</creatorcontrib><creatorcontrib>Jesse, S</creatorcontrib><creatorcontrib>Hartnett, C</creatorcontrib><creatorcontrib>Kalinin, S. V</creatorcontrib><creatorcontrib>Vasudevan, R. K</creatorcontrib><title>Electrocatalysis-induced elasticity modulation in a superionic proton conductor probed by band-excitation atomic force microscopy</title><title>Nanoscale</title><addtitle>Nanoscale</addtitle><description>Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe. At a sample temperature of 150 °C and under an applied bias <1 V, reduction currents of up to 1 nA were observed. Simultaneously, we show that the electrochemical reactions are accompanied by a reversible decrease in the elastic modulus of CsHSO
4
, as seen by a contact resonance shift, and find evidence for superplasticity during scanning. These effects were not observed in the room-temperature phase of CsHSO
4
or in the case of catalytically inactive conductive probes, proving the utility of this technique for monitoring electrochemical processes on the nanoscale, as well as the use of local contact stiffness as a sensitive indicator of electrochemical reactions.
Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe.</description><subject>Atomic force microscopy</subject><subject>Chemical reactions</subject><subject>Conductors (devices)</subject><subject>Contact</subject><subject>Modulation</subject><subject>Nanostructure</subject><subject>Phase shift</subject><subject>Scanning</subject><issn>2040-3364</issn><issn>2040-3372</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkcuL1TAUxoMozkM37pW6E6GaR5O0y-FyHYVhBkTXJT05gUjb1CQFu5z_3FzveN05i5Dz-H0fCR8hrxj9wKjoPoKcI21a2uETcs5pQ2shNH96qlVzRi5S-kGp6oQSz8kZV1K1jKlzcr8fEXIMYLIZt-RT7We7AtoKR5OyB5-3agp2HU32Ya78XJkqrQvG0nmolhhyGUM4qHKIh8FQ1MNWDWa2Nf4qDkepyWEqChciYFWqGBKEZXtBnjkzJnz5cF-S75_233af65u76y-7q5sahGpzjQPYlupyGs2dpUwiBWEpFY6h4kxayfkghbStcxwFONAAjGNjDLZCikvy7uhbXvhzxZT7ySfAcTQzhjX1rGWy65hq9OOoFrrRnda0oO-P6OE7KaLrl-gnE7ee0f6QTr-Tt1__pLMv8JsH33WY0J7Qv3EU4PURiAlO23_xlv3b_-37xTrxG_ylo00</recordid><startdate>20151221</startdate><enddate>20151221</enddate><creator>Papandrew, A. B</creator><creator>Li, Q</creator><creator>Okatan, M. B</creator><creator>Jesse, S</creator><creator>Hartnett, C</creator><creator>Kalinin, S. V</creator><creator>Vasudevan, R. K</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20151221</creationdate><title>Electrocatalysis-induced elasticity modulation in a superionic proton conductor probed by band-excitation atomic force microscopy</title><author>Papandrew, A. B ; Li, Q ; Okatan, M. B ; Jesse, S ; Hartnett, C ; Kalinin, S. V ; Vasudevan, R. K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-ebcd807d80472fd015e0c3d003f1e6215d522b535d8ff2e3cfc7cc12e4aae8353</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Atomic force microscopy</topic><topic>Chemical reactions</topic><topic>Conductors (devices)</topic><topic>Contact</topic><topic>Modulation</topic><topic>Nanostructure</topic><topic>Phase shift</topic><topic>Scanning</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Papandrew, A. B</creatorcontrib><creatorcontrib>Li, Q</creatorcontrib><creatorcontrib>Okatan, M. B</creatorcontrib><creatorcontrib>Jesse, S</creatorcontrib><creatorcontrib>Hartnett, C</creatorcontrib><creatorcontrib>Kalinin, S. V</creatorcontrib><creatorcontrib>Vasudevan, R. K</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nanoscale</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Papandrew, A. B</au><au>Li, Q</au><au>Okatan, M. B</au><au>Jesse, S</au><au>Hartnett, C</au><au>Kalinin, S. V</au><au>Vasudevan, R. K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrocatalysis-induced elasticity modulation in a superionic proton conductor probed by band-excitation atomic force microscopy</atitle><jtitle>Nanoscale</jtitle><addtitle>Nanoscale</addtitle><date>2015-12-21</date><risdate>2015</risdate><volume>7</volume><issue>47</issue><spage>289</spage><epage>294</epage><pages>289-294</pages><issn>2040-3364</issn><eissn>2040-3372</eissn><abstract>Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe. At a sample temperature of 150 °C and under an applied bias <1 V, reduction currents of up to 1 nA were observed. Simultaneously, we show that the electrochemical reactions are accompanied by a reversible decrease in the elastic modulus of CsHSO
4
, as seen by a contact resonance shift, and find evidence for superplasticity during scanning. These effects were not observed in the room-temperature phase of CsHSO
4
or in the case of catalytically inactive conductive probes, proving the utility of this technique for monitoring electrochemical processes on the nanoscale, as well as the use of local contact stiffness as a sensitive indicator of electrochemical reactions.
Variable temperature band-excitation atomic force microscopy in conjunction with
I
-
V
spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO
4
during proton exchange induced by a Pt-coated conductive scanning probe.</abstract><cop>England</cop><pmid>26568116</pmid><doi>10.1039/c5nr04809e</doi><tpages>6</tpages></addata></record> |
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language | eng |
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source | Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection |
subjects | Atomic force microscopy Chemical reactions Conductors (devices) Contact Modulation Nanostructure Phase shift Scanning |
title | Electrocatalysis-induced elasticity modulation in a superionic proton conductor probed by band-excitation atomic force microscopy |
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