Validation of EVM Method for Filter Test Using Butterworth and Chebyshev Filters
The error vector magnitude (EVM), used generally to quantify digital communication performances, will be used in this paper in order to test RF device performances. This RF test particularly developed for industries will respond to time and cost-reduction requirements. The method is based on the sim...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2016-03, Vol.64 (3), p.952-960 |
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| container_title | IEEE transactions on microwave theory and techniques |
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| creator | Sahyoun, Walaa Duchamp, Jean-Marc Benech, Philippe |
| description | The error vector magnitude (EVM), used generally to quantify digital communication performances, will be used in this paper in order to test RF device performances. This RF test particularly developed for industries will respond to time and cost-reduction requirements. The method is based on the simplest digital modulation, quadrature phase-shift keying modulation on an RF carrier frequency. Primary results based on this method have been obtained using Butterworth and Chebyshev RF filters. In this work we improve the sensitivity of the EVM parameter to filter characteristics as the center frequency, the bandwidth, the insertions losses, and the ripples in the passband. Simulations with ADS Ptolemy and measurements are done for both filter types with the aim of defining their EVM signatures in the passband. |
| doi_str_mv | 10.1109/TMTT.2016.2518170 |
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This RF test particularly developed for industries will respond to time and cost-reduction requirements. The method is based on the simplest digital modulation, quadrature phase-shift keying modulation on an RF carrier frequency. Primary results based on this method have been obtained using Butterworth and Chebyshev RF filters. In this work we improve the sensitivity of the EVM parameter to filter characteristics as the center frequency, the bandwidth, the insertions losses, and the ripples in the passband. Simulations with ADS Ptolemy and measurements are done for both filter types with the aim of defining their EVM signatures in the passband.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2016.2518170</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Bit error rate ; Chebyshev approximation ; Devices ; Digital ; Error vector magnitude (EVM) ; filters ; Industrial development ; Modulation ; Passband ; Performance evaluation ; Phase shift keying ; Radio frequencies ; Radio frequency ; Ripples ; Signal to noise ratio ; Signatures ; test</subject><ispartof>IEEE transactions on microwave theory and techniques, 2016-03, Vol.64 (3), p.952-960</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Simulations with ADS Ptolemy and measurements are done for both filter types with the aim of defining their EVM signatures in the passband.</description><subject>Bit error rate</subject><subject>Chebyshev approximation</subject><subject>Devices</subject><subject>Digital</subject><subject>Error vector magnitude (EVM)</subject><subject>filters</subject><subject>Industrial development</subject><subject>Modulation</subject><subject>Passband</subject><subject>Performance evaluation</subject><subject>Phase shift keying</subject><subject>Radio frequencies</subject><subject>Radio frequency</subject><subject>Ripples</subject><subject>Signal to noise ratio</subject><subject>Signatures</subject><subject>test</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMtOwzAQRS0EEuXxAYiNJTZsUjx2_FpCVR5SK1gEtpbT2DRVGhc7AfXvSdWKBavRjM4dXR2EroCMAYi-K-ZFMaYExJhyUCDJERoB5zLTQpJjNCIEVKZzRU7RWUqrYc05USP09mGburJdHVocPJ5-zPHcdctQYR8ifqybzkVcuNTh91S3n_ih74bLT4jdEtu2wpOlK7dp6b4PbLpAJ942yV0e5jl6f5wWk-ds9vr0MrmfZQumRZd54qUslc9tWbEcPAWrSAmghWVaAaVUlKJiAFJ4woV0Lge-0JbqnDDuKTtHt_u_mxi--qGgWddp4ZrGti70yQwSuFY6F2JAb_6hq9DHdmhnQCpJFTCiBgr21CKGlKLzZhPrtY1bA8TsHJudY7NzbA6Oh8z1PlM75_54yTRhlLNfJRN1ww</recordid><startdate>20160301</startdate><enddate>20160301</enddate><creator>Sahyoun, Walaa</creator><creator>Duchamp, Jean-Marc</creator><creator>Benech, Philippe</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| subjects | Bit error rate Chebyshev approximation Devices Digital Error vector magnitude (EVM) filters Industrial development Modulation Passband Performance evaluation Phase shift keying Radio frequencies Radio frequency Ripples Signal to noise ratio Signatures test |
| title | Validation of EVM Method for Filter Test Using Butterworth and Chebyshev Filters |
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