The Electrical and Microstructural Properties of Zr-doped LaNbO sub(4) Thin Ceramic Films

In the current research thin Zr-doped lanthanum niobium oxide (LaNb sub(1-x)Zr sub(x)O sub(4)) films deposited by magnetron sputtering were studied to investigate their microstructural and electrical properties. The main attention is paid to the electrical processes in the formed thin films, e.g. re...

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Veröffentlicht in:	Medžiagotyra 2015-01, Vol.21 (3), p.439-443
Hauptverfasser:	Virbukas, Darius, Bockute, Kristina, Laukaitis, Giedrius
Format:	Artikel
Sprache:	eng
Schlagworte:	Activation energy Ceramics Dopants Microstructure Relaxation time Thin films X-rays Zirconium
Online-Zugang:	Volltext
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