Compact stabilized semiconductor laser for frequency metrology

We report on the development of a frequency modulatable 795 nm semiconductor laser based on self-injection locking to a high-quality-factor whispering-gallery-mode microresonator. The laser is characterized by residual amplitude modulation below -80  dB and frequency noise better than 300  Hz/Hz(1/2...

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Veröffentlicht in:Applied Optics 2015-04, Vol.54 (11), p.3353-3359
Hauptverfasser: Liang, Wei, Ilchenko, Vladimir S, Eliyahu, Danny, Dale, Elijah, Savchenkov, Anatoliy A, Seidel, David, Matsko, Andrey B, Maleki, Lute
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Sprache:eng
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Zusammenfassung:We report on the development of a frequency modulatable 795 nm semiconductor laser based on self-injection locking to a high-quality-factor whispering-gallery-mode microresonator. The laser is characterized by residual amplitude modulation below -80  dB and frequency noise better than 300  Hz/Hz(1/2) at offset frequencies ranging from 100 Hz to 10 MHz. The frequency modulation speed and span of the laser exceed 1 MHz and 4 GHz, respectively. Locking of the laser to the Doppler-free saturated absorption resonance of the (87)Rb D1 line is demonstrated and relative frequency stability better than 10(-12) is measured for integration time spanning from 1 s to 1 day. The architecture demonstrated in this study is suitable for the realization of frequency modulatable lasers at any wavelength.
ISSN:0003-6935
1559-128X
2155-3165
1539-4522
DOI:10.1364/AO.54.003353