Super-resolution deep imaging with hollow Bessel beam STED microscopy

Stimulated emission depletion (STED) microscopy has become a powerful imaging and localized excitation method, breaking the diffraction barrier for improved spatial resolution in cellular imaging, lithography, etc. Because of specimen‐induced aberrations and scattering distortion, it is a great chal...

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Veröffentlicht in:	Laser & photonics reviews 2016-01, Vol.10 (1), p.147-152
Hauptverfasser:	Yu, Wentao, Ji, Ziheng, Dong, Dashan, Yang, Xusan, Xiao, Yunfeng, Gong, Qihuang, Xi, Peng, Shi, Kebin
Format:	Artikel
Sprache:	eng
Schlagworte:	Aberration Beams (radiation) Bessel beam Brain Breaking deep imaging Depletion Diffraction Distortion Excitation Gaussian beams (optics) Image resolution Imaging Lasers Lithography Microscopy Paving Penetration Scattering Spatial resolution Stimulated emission Stimulated emission depletion microscopy super resolution Three dimensional
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