Measurement of synchrotron-radiation-excited Kossel patterns

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structu...

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Veröffentlicht in:	Journal of synchrotron radiation 2016-01, Vol.23 (1), p.214-218
Hauptverfasser:	Bortel, G., Faigel, G., Tegze, M., Chumakov, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic structure Beams (radiation) Detectors diffraction Excitation fluorescence High resolution Kossel pattern Photon beams Photons
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