Applicability study of the structure‐factor phase method for determining the polarity of binary semiconductors

The structure‐factor phase method of convergent‐beam electron diffraction (CBED) has been widely applied as an effective tool in determining the polarity of binary compound materials, for example, the typical sphalerite material, GaAs. However, its validity on other polar materials is still unknown....

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Veröffentlicht in:	Acta crystallographica Section B, Structural science, crystal engineering and materials Structural science, crystal engineering and materials, 2013-12, Vol.69 (6), p.556-562
Hauptverfasser:	Cao, Jiefeng, Guo, Chao, Zou, Huamin
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic properties Atomic structure binary semiconductors convergent‐beam electron diffraction Crystal structure Crystallography Diffraction Electron diffraction Polarity Semiconductors Simulation Sphalerite
Online-Zugang:	Volltext
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