Band gap and conductivity variations of ZnO nano structured thin films annealed under Vacuum

Zinc Oxide thin films were prepared by Successive Ionic layer adsorption and reaction technique(SILAR). The samples were annealed under vacuum and conductivity of the samples were taken at different temperatures. UV Spectrograph of the samples were taken and the band gap of each sample was found fro...

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Veröffentlicht in:IOP conference series. Materials Science and Engineering 2015-01, Vol.73 (1), p.12107
Hauptverfasser: Vattappalam, Sunil C, Thomas, Deepu, Raju, Mathew T, Augustine, Simon, Mathew, Sunny
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Thomas, Deepu
Raju, Mathew T
Augustine, Simon
Mathew, Sunny
description Zinc Oxide thin films were prepared by Successive Ionic layer adsorption and reaction technique(SILAR). The samples were annealed under vacuum and conductivity of the samples were taken at different temperatures. UV Spectrograph of the samples were taken and the band gap of each sample was found from the data. All the results were compared with that of the sample annealed under air. It was observed that the band gap decreases and concequently conductivity of the samples increases when the samples are annealed under vacuum.
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subjects Annealing
Band spectra
Banded structure
Energy gap
Materials science
Nanostructure
Spectrographs
Thin films
Zinc oxide
Zinc oxides
title Band gap and conductivity variations of ZnO nano structured thin films annealed under Vacuum
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