Optimal sequential Bayesian analysis for degradation tests

Degradation tests are especially difficult to conduct for items with high reliability. Test costs, caused mainly by prolonged item duration and item destruction costs, establish the necessity of sequential degradation test designs. We propose a methodology that sequentially selects the optimal obser...

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Veröffentlicht in:Lifetime data analysis 2016-07, Vol.22 (3), p.405-428
Hauptverfasser: Rodríguez-Narciso, Silvia, Christen, J. Andrés
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Sprache:eng
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