Field evaporation of insulators and semiconductors: Theoretical insights for ZnO

We look at the new challenges associated with Atom Probe Tomography of insulators and semiconductors with regard to local fields inside and on the surface of such materials. The theoretical discovery that in high fields the band gap in these materials is drastically reduced to the point where at the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Ultramicroscopy 2015-12, Vol.159, p.156-161
Hauptverfasser:	Karahka, Markus, Kreuzer, H.J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atom Probe Density functional theory Electric fields Electronics Evaporation Field evaporation Field strength Fragments Insulators Semiconductors Zinc oxide
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!