Dynamic Trace Signal Selection for Post-Silicon Validation

In order to gain market share in today's competitive high-tech industry, fast time-to-market (TTM) is one of the key factors for the success of a product. Since pre-silicon verification cannot be applied exhaustively as the size and complexity of the integrated circuit design increases, post-si...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kihyuk Han, Joon-Sung Yang, Abraham, J. A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithms Benchmark testing Conferences Debugging Design engineering Dynamics Heuristic algorithms Integrated circuit modeling Integrated circuits Logic gates Markets Restoration System-on-chip Vectors Very large scale integration
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