Sneak-path Testing of Memristor-based Memories

Memristors are an attractive option for use in future memory architectures due to their non-volatility, low power operation and compactness. Notwithstanding these advantages, memristors and memristor-based memories are prone to high defect densities due to the non-deterministic nature of nanoscale f...

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Bibliographische Detailangaben
Hauptverfasser:	Kannan, S., Rajendran, J., Karri, R., Sinanoglu, O.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Conferences Current measurement Defects Density Design engineering emerging memory technologies fault modeling Integrated circuit modeling Integrated circuits Memory devices memory testing Memristors metal-oxide memristors Nanoscale devices Resistance Resistors Testing Very large scale integration
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