Sneak-path Testing of Memristor-based Memories
Memristors are an attractive option for use in future memory architectures due to their non-volatility, low power operation and compactness. Notwithstanding these advantages, memristors and memristor-based memories are prone to high defect densities due to the non-deterministic nature of nanoscale f...
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| creator | Kannan, S. Rajendran, J. Karri, R. Sinanoglu, O. |
| description | Memristors are an attractive option for use in future memory architectures due to their non-volatility, low power operation and compactness. Notwithstanding these advantages, memristors and memristor-based memories are prone to high defect densities due to the non-deterministic nature of nanoscale fabrication. As a first step, we will examine the defect mechanisms in memristors and develop efficient fault models. Next, the memory subsystem has to be tested. The typical approach to testing a memory subsystem entails testing one memory element at a time. This is time consuming and does not scale for dense, memristor-based memories. We propose an efficient testing technique to test memristor-based memories. The proposed scheme uses sneak-paths inherent in crossbar memories to test multiple memristors at the same time and thereby reduces the test time by ~32%. |
| doi_str_mv | 10.1109/VLSID.2013.219 |
| format | Conference Proceeding |
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The proposed scheme uses sneak-paths inherent in crossbar memories to test multiple memristors at the same time and thereby reduces the test time by ~32%.</description><subject>Circuit faults</subject><subject>Conferences</subject><subject>Current measurement</subject><subject>Defects</subject><subject>Density</subject><subject>Design engineering</subject><subject>emerging memory technologies</subject><subject>fault modeling</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuits</subject><subject>Memory devices</subject><subject>memory testing</subject><subject>Memristors</subject><subject>metal-oxide memristors</subject><subject>Nanoscale devices</subject><subject>Resistance</subject><subject>Resistors</subject><subject>Testing</subject><subject>Very large scale integration</subject><issn>1063-9667</issn><issn>2380-6923</issn><isbn>146734639X</isbn><isbn>9781467346399</isbn><isbn>9780769548890</isbn><isbn>076954889X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjjtPwzAUhc1Loi1dWVg6sjhc2_H19YhaHpWKGFoQW-QkDhiSpsTpwL8nqJzl6EifPh3GLgUkQoC9eV2tl4tEglCJFPaITa0hMGh1SmThmI2kIuBopTphY5GiUSkq-3bKRgJQcYtoztk4xk8AIA1mxJL11rsvvnP9x2zjYx-277O2mj35pguxbzueu-jLv912wccLdla5Ovrpf0_Yy_3dZv7IV88Py_ntigcJ1HMrdS6LEqkq8hxyXWJFWhmXp1IbIj88TIUfUnpHEn1ZaQlGKCe0UkYVasKuD95d137vh19ZE2Lh69ptfbuPmTCEUpASOKBXBzQMvmzXhcZ1PxmmRuJg_AX1ClQ2</recordid><startdate>201301</startdate><enddate>201301</enddate><creator>Kannan, S.</creator><creator>Rajendran, J.</creator><creator>Karri, R.</creator><creator>Sinanoglu, O.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>201301</creationdate><title>Sneak-path Testing of Memristor-based Memories</title><author>Kannan, S. ; Rajendran, J. ; Karri, R. ; Sinanoglu, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i208t-925b2cd68fcbb0b5d6f8537ab425788e69241eeeedea826edf520713a153373c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Circuit faults</topic><topic>Conferences</topic><topic>Current measurement</topic><topic>Defects</topic><topic>Density</topic><topic>Design engineering</topic><topic>emerging memory technologies</topic><topic>fault modeling</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuits</topic><topic>Memory devices</topic><topic>memory testing</topic><topic>Memristors</topic><topic>metal-oxide memristors</topic><topic>Nanoscale devices</topic><topic>Resistance</topic><topic>Resistors</topic><topic>Testing</topic><topic>Very large scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>Kannan, S.</creatorcontrib><creatorcontrib>Rajendran, J.</creatorcontrib><creatorcontrib>Karri, R.</creatorcontrib><creatorcontrib>Sinanoglu, O.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kannan, S.</au><au>Rajendran, J.</au><au>Karri, R.</au><au>Sinanoglu, O.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sneak-path Testing of Memristor-based Memories</atitle><btitle>2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems</btitle><stitle>ICVD</stitle><date>2013-01</date><risdate>2013</risdate><spage>386</spage><epage>391</epage><pages>386-391</pages><issn>1063-9667</issn><eissn>2380-6923</eissn><isbn>146734639X</isbn><isbn>9781467346399</isbn><eisbn>9780769548890</eisbn><eisbn>076954889X</eisbn><coden>IEEPAD</coden><abstract>Memristors are an attractive option for use in future memory architectures due to their non-volatility, low power operation and compactness. 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| identifier | ISSN: 1063-9667 |
| ispartof | 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems, 2013, p.386-391 |
| issn | 1063-9667 2380-6923 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit faults Conferences Current measurement Defects Density Design engineering emerging memory technologies fault modeling Integrated circuit modeling Integrated circuits Memory devices memory testing Memristors metal-oxide memristors Nanoscale devices Resistance Resistors Testing Very large scale integration |
| title | Sneak-path Testing of Memristor-based Memories |
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