Properties of microplasmas excited by microwaves for VUV photon sources
Microplasma sources typically take advantage of pd (pressure × size) scaling by increasing pressure to operate at dimensions as small as tens of microns. In many applications, low pressure operation is desirable, which makes miniaturization difficult. In this paper, the characteristics of low pres...
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Veröffentlicht in: | Plasma sources science & technology 2015-10, Vol.24 (6), p.65009 |
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creator | Cooley, James E Urdahl, Randall Xue, Jun Denning, Mark Tian, Peng Kushner, Mark J |
description | Microplasma sources typically take advantage of pd (pressure × size) scaling by increasing pressure to operate at dimensions as small as tens of microns. In many applications, low pressure operation is desirable, which makes miniaturization difficult. In this paper, the characteristics of low pressure microplasma sources excited by microwave power are discussed based on results from experimental and computational studies. The intended application is production of VUV radiation for chemical analysis, and so emphasis in this study is on the production of resonant excited states of rare gases and radiation transport. The systems of interest operate at a few to 10 Torr in Ar and He/Ar mixtures with cavity dimensions of hundreds of microns to 1 mm. Power deposition is a few watts which produces fractional ionization of about 0.1%. We found that production of VUV radiation from argon microplasmas at 104.8 nm and 106.7 nm saturates as a function of power deposition due to a quasi-equilibrium that is established between the electron temperature (that is not terribly sensitive to power deposition) and the population of the Ar(4s) manifold. |
doi_str_mv | 10.1088/0963-0252/24/6/065009 |
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In many applications, low pressure operation is desirable, which makes miniaturization difficult. In this paper, the characteristics of low pressure microplasma sources excited by microwave power are discussed based on results from experimental and computational studies. The intended application is production of VUV radiation for chemical analysis, and so emphasis in this study is on the production of resonant excited states of rare gases and radiation transport. The systems of interest operate at a few to 10 Torr in Ar and He/Ar mixtures with cavity dimensions of hundreds of microns to 1 mm. Power deposition is a few watts which produces fractional ionization of about 0.1%. We found that production of VUV radiation from argon microplasmas at 104.8 nm and 106.7 nm saturates as a function of power deposition due to a quasi-equilibrium that is established between the electron temperature (that is not terribly sensitive to power deposition) and the population of the Ar(4s) manifold.</description><identifier>ISSN: 0963-0252</identifier><identifier>EISSN: 1361-6595</identifier><identifier>DOI: 10.1088/0963-0252/24/6/065009</identifier><identifier>CODEN: PSTEEU</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>Deposition ; diagnostics ; Excitation ; Ionization ; Low pressure ; microplasma ; Microplasmas ; Microwaves ; Miniaturization ; modeling ; Radiation transport ; VUV radiation</subject><ispartof>Plasma sources science & technology, 2015-10, Vol.24 (6), p.65009</ispartof><rights>2015 IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-db6dbd4db84edcfab32e311ac21939805408acc2e798d47d720c66dead2bf5b23</citedby><cites>FETCH-LOGICAL-c361t-db6dbd4db84edcfab32e311ac21939805408acc2e798d47d720c66dead2bf5b23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0963-0252/24/6/065009/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27923,27924,53845,53892</link.rule.ids></links><search><creatorcontrib>Cooley, James E</creatorcontrib><creatorcontrib>Urdahl, Randall</creatorcontrib><creatorcontrib>Xue, Jun</creatorcontrib><creatorcontrib>Denning, Mark</creatorcontrib><creatorcontrib>Tian, Peng</creatorcontrib><creatorcontrib>Kushner, Mark J</creatorcontrib><title>Properties of microplasmas excited by microwaves for VUV photon sources</title><title>Plasma sources science & technology</title><addtitle>PSST</addtitle><addtitle>Plasma Sources Sci. 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We found that production of VUV radiation from argon microplasmas at 104.8 nm and 106.7 nm saturates as a function of power deposition due to a quasi-equilibrium that is established between the electron temperature (that is not terribly sensitive to power deposition) and the population of the Ar(4s) manifold.</description><subject>Deposition</subject><subject>diagnostics</subject><subject>Excitation</subject><subject>Ionization</subject><subject>Low pressure</subject><subject>microplasma</subject><subject>Microplasmas</subject><subject>Microwaves</subject><subject>Miniaturization</subject><subject>modeling</subject><subject>Radiation transport</subject><subject>VUV radiation</subject><issn>0963-0252</issn><issn>1361-6595</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp9kM1KxDAUhYMoOI4-gtClm9okTdJ0KYOOwoAunNmGND_YoZ3EpKPO25tSURfi6nIvH-fccwC4RPAaQc4LWLMyh5jiApOCFZBRCOsjMEMlQzmjNT0Gs2_mFJzFuIUQIY6rGVg-BedNGFoTM2ezvlVp72TsZczMh2oHo7PmMN3f5VuirAvZZr3J_Isb3C6Lbh-UiefgxMoumouvOQfru9vnxX2-elw-LG5WuUrPDLlumG400Q0nRisrmxKbEiGpMKrLmkNKIJdKYVPVXJNKVxgqxrSRGjeWNricg6tJ1wf3ujdxEH0blek6uTNuHwWqOMOQIUwSSic0vR5jMFb40PYyHASCYixOjKWIsRSBiWBiKu7HonVebFO8XQokfExevzDhtU0o-gP9X_4TdFx-PQ</recordid><startdate>20151027</startdate><enddate>20151027</enddate><creator>Cooley, James E</creator><creator>Urdahl, Randall</creator><creator>Xue, Jun</creator><creator>Denning, Mark</creator><creator>Tian, Peng</creator><creator>Kushner, Mark J</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20151027</creationdate><title>Properties of microplasmas excited by microwaves for VUV photon sources</title><author>Cooley, James E ; Urdahl, Randall ; Xue, Jun ; Denning, Mark ; Tian, Peng ; Kushner, Mark J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-db6dbd4db84edcfab32e311ac21939805408acc2e798d47d720c66dead2bf5b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Deposition</topic><topic>diagnostics</topic><topic>Excitation</topic><topic>Ionization</topic><topic>Low pressure</topic><topic>microplasma</topic><topic>Microplasmas</topic><topic>Microwaves</topic><topic>Miniaturization</topic><topic>modeling</topic><topic>Radiation transport</topic><topic>VUV radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cooley, James E</creatorcontrib><creatorcontrib>Urdahl, Randall</creatorcontrib><creatorcontrib>Xue, Jun</creatorcontrib><creatorcontrib>Denning, Mark</creatorcontrib><creatorcontrib>Tian, Peng</creatorcontrib><creatorcontrib>Kushner, Mark J</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Plasma sources science & technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cooley, James E</au><au>Urdahl, Randall</au><au>Xue, Jun</au><au>Denning, Mark</au><au>Tian, Peng</au><au>Kushner, Mark J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Properties of microplasmas excited by microwaves for VUV photon sources</atitle><jtitle>Plasma sources science & technology</jtitle><stitle>PSST</stitle><addtitle>Plasma Sources Sci. Technol</addtitle><date>2015-10-27</date><risdate>2015</risdate><volume>24</volume><issue>6</issue><spage>65009</spage><pages>65009-</pages><issn>0963-0252</issn><eissn>1361-6595</eissn><coden>PSTEEU</coden><abstract>Microplasma sources typically take advantage of pd (pressure × size) scaling by increasing pressure to operate at dimensions as small as tens of microns. In many applications, low pressure operation is desirable, which makes miniaturization difficult. In this paper, the characteristics of low pressure microplasma sources excited by microwave power are discussed based on results from experimental and computational studies. The intended application is production of VUV radiation for chemical analysis, and so emphasis in this study is on the production of resonant excited states of rare gases and radiation transport. The systems of interest operate at a few to 10 Torr in Ar and He/Ar mixtures with cavity dimensions of hundreds of microns to 1 mm. Power deposition is a few watts which produces fractional ionization of about 0.1%. We found that production of VUV radiation from argon microplasmas at 104.8 nm and 106.7 nm saturates as a function of power deposition due to a quasi-equilibrium that is established between the electron temperature (that is not terribly sensitive to power deposition) and the population of the Ar(4s) manifold.</abstract><pub>IOP Publishing</pub><doi>10.1088/0963-0252/24/6/065009</doi><tpages>14</tpages></addata></record> |
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subjects | Deposition diagnostics Excitation Ionization Low pressure microplasma Microplasmas Microwaves Miniaturization modeling Radiation transport VUV radiation |
title | Properties of microplasmas excited by microwaves for VUV photon sources |
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