Exciton mapping at subwavelength scales in two-dimensional materials

Spatially resolved electron-energy-loss spectroscopy (EELS) is performed at diffuse interfaces between MoS2 and MoSe2 single layers. With a monochromated electron source (20 meV) we successfully probe excitons near the interface by obtaining the low loss spectra at the nanometer scale. The exciton m...

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Veröffentlicht in:Physical review letters 2015-03, Vol.114 (10), p.107601-107601, Article 107601
Hauptverfasser: Tizei, Luiz H G, Lin, Yung-Chang, Mukai, Masaki, Sawada, Hidetaka, Lu, Ang-Yu, Li, Lain-Jong, Kimoto, Koji, Suenaga, Kazu
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Sprache:eng
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