Functional self-test of high-performance pipe-lined signal processing architectures

We propose a new methodology for Built-In Self-Test (BIST) where contrary to the traditional scan-path based Logic BIST, the proposed solution for test generation does not need any additional hardware, and will not have any impact on the working performance of the system. A class of digital systems...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Microprocessors and microsystems 2015-11, Vol.39 (8), p.909-918
Hauptverfasser:	Gorev, Maksim, Ubar, Raimund, Ellervee, Peeter, Devadze, Sergei, Raik, Jaan, Min, Mart
Format:	Artikel
Sprache:	eng
Schlagworte:	Architecture (computers) At-speed testing Built-in self-test Design for testability Dynamical systems Dynamics Faults Hardware Microprocessors On-line systems Pipe-lined signal processing architectures Signal processing
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!