Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

•Layers of π-conjugated MDMO-PPV, PCDTBT, and PCBTDPP polymers blended with PC60BM and PC70BM fullerenes.•Materials have intensively been studied for their potential application in photovoltaics.•Determination of complex refractive indexes of organic thin films by spectroscopic ellipsometry.•Multi-i...

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Veröffentlicht in:	Applied surface science 2015-09, Vol.349, p.582-588
Hauptverfasser:	Schmiedova, V., Heinrichova, P., Zmeskal, O., Weiter, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Assessments Ellipsometry Organic materials Photovoltaic cells Profilometry Refractive index Refractivity Solar cells Spectroscopic ellipsometry Spectroscopy Thin films UV–vis absorption
Online-Zugang:	Volltext
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