Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics
A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of th...
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Veröffentlicht in: | IEEE transactions on power electronics 2016-02, Vol.31 (2), p.1588-1599 |
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creator | Wenguan Wang Liu, Alex Chun-For Chung, Henry Shu-Hung Lau, Ricky Wing-Hong Jun Zhang Lo, Alan Wai-Lun |
description | A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability. |
doi_str_mv | 10.1109/TPEL.2015.2424079 |
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While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability.</description><identifier>ISSN: 0885-8993</identifier><identifier>EISSN: 1941-0107</identifier><identifier>DOI: 10.1109/TPEL.2015.2424079</identifier><identifier>CODEN: ITPEE8</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithms ; Capacitance ; Computer architecture ; Current-voltage characteristics ; Devices ; Dynamics ; Electric currents ; Failure ; Fault diagnosis ; Junctions ; Panels ; Parameter estimation ; Photovoltaic cells ; Photovoltaic systems ; Prototypes ; reliability ; Solar cells ; solar panels</subject><ispartof>IEEE transactions on power electronics, 2016-02, Vol.31 (2), p.1588-1599</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Feb 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</citedby><cites>FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</cites><orcidid>0000-0003-4890-8256</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7088656$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7088656$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wenguan Wang</creatorcontrib><creatorcontrib>Liu, Alex Chun-For</creatorcontrib><creatorcontrib>Chung, Henry Shu-Hung</creatorcontrib><creatorcontrib>Lau, Ricky Wing-Hong</creatorcontrib><creatorcontrib>Jun Zhang</creatorcontrib><creatorcontrib>Lo, Alan Wai-Lun</creatorcontrib><title>Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics</title><title>IEEE transactions on power electronics</title><addtitle>TPEL</addtitle><description>A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. 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While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. 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subjects | Algorithms Capacitance Computer architecture Current-voltage characteristics Devices Dynamics Electric currents Failure Fault diagnosis Junctions Panels Parameter estimation Photovoltaic cells Photovoltaic systems Prototypes reliability Solar cells solar panels |
title | Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics |
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