Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics

A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on power electronics 2016-02, Vol.31 (2), p.1588-1599
Hauptverfasser: Wenguan Wang, Liu, Alex Chun-For, Chung, Henry Shu-Hung, Lau, Ricky Wing-Hong, Jun Zhang, Lo, Alan Wai-Lun
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1599
container_issue 2
container_start_page 1588
container_title IEEE transactions on power electronics
container_volume 31
creator Wenguan Wang
Liu, Alex Chun-For
Chung, Henry Shu-Hung
Lau, Ricky Wing-Hong
Jun Zhang
Lo, Alan Wai-Lun
description A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability.
doi_str_mv 10.1109/TPEL.2015.2424079
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1778043565</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7088656</ieee_id><sourcerecordid>1778043565</sourcerecordid><originalsourceid>FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</originalsourceid><addsrcrecordid>eNpdkEtLAzEUhYMoWKs_QNwMuHEz9eYxeSylrQ8o2EV1O6Qh06ZMJzXJCP33Zqi4kLu4cPnOuYeD0C2GCcagHlfL-WJCAFcTwggDoc7QCCuGS8AgztEIpKxKqRS9RFcx7gAwqwCP0OpZ920qZk5vOh9dLHxTLLc--W_fJu1MsdSdbWPxEV23KWbHTu_zcdqHYLtUfg7QxhbTrQ7aJBtcTM7Ea3TR6Dbam989zm_mq-lruXh_eZs-LUrDOEnlWmCJK7BM60YpLa20hisqOFkTrixwLBkw0QChhkEjhKR5DNGWCS4oHaOHk-0h-K_exlTvXTS2bXNk38caZwUwWvEqo_f_0J3vQ5fDZYrkJyAVyRQ-USb4GINt6kNwex2ONYZ6qLkeaq6HmuvfmrPm7qRx1to_PvtJXnH6A7ffd4w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1720470892</pqid></control><display><type>article</type><title>Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics</title><source>IEEE Electronic Library (IEL)</source><creator>Wenguan Wang ; Liu, Alex Chun-For ; Chung, Henry Shu-Hung ; Lau, Ricky Wing-Hong ; Jun Zhang ; Lo, Alan Wai-Lun</creator><creatorcontrib>Wenguan Wang ; Liu, Alex Chun-For ; Chung, Henry Shu-Hung ; Lau, Ricky Wing-Hong ; Jun Zhang ; Lo, Alan Wai-Lun</creatorcontrib><description>A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability.</description><identifier>ISSN: 0885-8993</identifier><identifier>EISSN: 1941-0107</identifier><identifier>DOI: 10.1109/TPEL.2015.2424079</identifier><identifier>CODEN: ITPEE8</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithms ; Capacitance ; Computer architecture ; Current-voltage characteristics ; Devices ; Dynamics ; Electric currents ; Failure ; Fault diagnosis ; Junctions ; Panels ; Parameter estimation ; Photovoltaic cells ; Photovoltaic systems ; Prototypes ; reliability ; Solar cells ; solar panels</subject><ispartof>IEEE transactions on power electronics, 2016-02, Vol.31 (2), p.1588-1599</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Feb 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</citedby><cites>FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</cites><orcidid>0000-0003-4890-8256</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7088656$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7088656$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wenguan Wang</creatorcontrib><creatorcontrib>Liu, Alex Chun-For</creatorcontrib><creatorcontrib>Chung, Henry Shu-Hung</creatorcontrib><creatorcontrib>Lau, Ricky Wing-Hong</creatorcontrib><creatorcontrib>Jun Zhang</creatorcontrib><creatorcontrib>Lo, Alan Wai-Lun</creatorcontrib><title>Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics</title><title>IEEE transactions on power electronics</title><addtitle>TPEL</addtitle><description>A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability.</description><subject>Algorithms</subject><subject>Capacitance</subject><subject>Computer architecture</subject><subject>Current-voltage characteristics</subject><subject>Devices</subject><subject>Dynamics</subject><subject>Electric currents</subject><subject>Failure</subject><subject>Fault diagnosis</subject><subject>Junctions</subject><subject>Panels</subject><subject>Parameter estimation</subject><subject>Photovoltaic cells</subject><subject>Photovoltaic systems</subject><subject>Prototypes</subject><subject>reliability</subject><subject>Solar cells</subject><subject>solar panels</subject><issn>0885-8993</issn><issn>1941-0107</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkEtLAzEUhYMoWKs_QNwMuHEz9eYxeSylrQ8o2EV1O6Qh06ZMJzXJCP33Zqi4kLu4cPnOuYeD0C2GCcagHlfL-WJCAFcTwggDoc7QCCuGS8AgztEIpKxKqRS9RFcx7gAwqwCP0OpZ920qZk5vOh9dLHxTLLc--W_fJu1MsdSdbWPxEV23KWbHTu_zcdqHYLtUfg7QxhbTrQ7aJBtcTM7Ea3TR6Dbam989zm_mq-lruXh_eZs-LUrDOEnlWmCJK7BM60YpLa20hisqOFkTrixwLBkw0QChhkEjhKR5DNGWCS4oHaOHk-0h-K_exlTvXTS2bXNk38caZwUwWvEqo_f_0J3vQ5fDZYrkJyAVyRQ-USb4GINt6kNwex2ONYZ6qLkeaq6HmuvfmrPm7qRx1to_PvtJXnH6A7ffd4w</recordid><startdate>201602</startdate><enddate>201602</enddate><creator>Wenguan Wang</creator><creator>Liu, Alex Chun-For</creator><creator>Chung, Henry Shu-Hung</creator><creator>Lau, Ricky Wing-Hong</creator><creator>Jun Zhang</creator><creator>Lo, Alan Wai-Lun</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>F28</scope><orcidid>https://orcid.org/0000-0003-4890-8256</orcidid></search><sort><creationdate>201602</creationdate><title>Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics</title><author>Wenguan Wang ; Liu, Alex Chun-For ; Chung, Henry Shu-Hung ; Lau, Ricky Wing-Hong ; Jun Zhang ; Lo, Alan Wai-Lun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c462t-b718150e4aaf99a8e8ec693762b269e06184047f023c40f7783838c2ae476733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Algorithms</topic><topic>Capacitance</topic><topic>Computer architecture</topic><topic>Current-voltage characteristics</topic><topic>Devices</topic><topic>Dynamics</topic><topic>Electric currents</topic><topic>Failure</topic><topic>Fault diagnosis</topic><topic>Junctions</topic><topic>Panels</topic><topic>Parameter estimation</topic><topic>Photovoltaic cells</topic><topic>Photovoltaic systems</topic><topic>Prototypes</topic><topic>reliability</topic><topic>Solar cells</topic><topic>solar panels</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wenguan Wang</creatorcontrib><creatorcontrib>Liu, Alex Chun-For</creatorcontrib><creatorcontrib>Chung, Henry Shu-Hung</creatorcontrib><creatorcontrib>Lau, Ricky Wing-Hong</creatorcontrib><creatorcontrib>Jun Zhang</creatorcontrib><creatorcontrib>Lo, Alan Wai-Lun</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><jtitle>IEEE transactions on power electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wenguan Wang</au><au>Liu, Alex Chun-For</au><au>Chung, Henry Shu-Hung</au><au>Lau, Ricky Wing-Hong</au><au>Jun Zhang</au><au>Lo, Alan Wai-Lun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics</atitle><jtitle>IEEE transactions on power electronics</jtitle><stitle>TPEL</stitle><date>2016-02</date><risdate>2016</risdate><volume>31</volume><issue>2</issue><spage>1588</spage><epage>1599</epage><pages>1588-1599</pages><issn>0885-8993</issn><eissn>1941-0107</eissn><coden>ITPEE8</coden><abstract>A fault diagnosis technique for photovoltaic (PV) panels is presented. While a PV system is sampling the terminal voltage and current of its connected panel for tracking the maximum power point of the panels, the proposed technique utilizes the sampled data to estimate the intrinsic parameters of the panel simultaneously. Compared with the prior-art approach of using the static current-voltage characteristics, the proposed technique utilizes the dynamic current-voltage characteristics to determine the parameters. Apart from the fast parameter estimation, it also provides an in-depth understanding of the panel condition with the drift of the parameters. Several prototype devices with the proposed algorithm have been built. They are evaluated on a test bed with four 80-W panels, with two of them being healthy and the other two having different degrees of damage on the surfaces. Results reveal that the parameters of the cracked panels deviate significantly from their nominal values, giving a sign of panel failure. Furthermore, the device can communicate with and send the estimated parameters to the central control center over the panel cable via power line communication. The merits of this concept lie in its modularity, scalability, and remote fault diagnosis capability.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPEL.2015.2424079</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0003-4890-8256</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0885-8993
ispartof IEEE transactions on power electronics, 2016-02, Vol.31 (2), p.1588-1599
issn 0885-8993
1941-0107
language eng
recordid cdi_proquest_miscellaneous_1778043565
source IEEE Electronic Library (IEL)
subjects Algorithms
Capacitance
Computer architecture
Current-voltage characteristics
Devices
Dynamics
Electric currents
Failure
Fault diagnosis
Junctions
Panels
Parameter estimation
Photovoltaic cells
Photovoltaic systems
Prototypes
reliability
Solar cells
solar panels
title Fault Diagnosis of Photovoltaic Panels Using Dynamic Current-Voltage Characteristics
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-16T02%3A58%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fault%20Diagnosis%20of%20Photovoltaic%20Panels%20Using%20Dynamic%20Current-Voltage%20Characteristics&rft.jtitle=IEEE%20transactions%20on%20power%20electronics&rft.au=Wenguan%20Wang&rft.date=2016-02&rft.volume=31&rft.issue=2&rft.spage=1588&rft.epage=1599&rft.pages=1588-1599&rft.issn=0885-8993&rft.eissn=1941-0107&rft.coden=ITPEE8&rft_id=info:doi/10.1109/TPEL.2015.2424079&rft_dat=%3Cproquest_RIE%3E1778043565%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1720470892&rft_id=info:pmid/&rft_ieee_id=7088656&rfr_iscdi=true