Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle

Due to the large degree of ionization of the sputtered flux and high quality film fabrication, high power pulsed magnetron sputtering (HPPMS) is widely used. However, compared with DC sputtering, low deposition rate is probably the drawback of the HPPMS technique and restricts its application. In or...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Surface & coatings technology 2015-11, Vol.281, p.27-34
Hauptverfasser: Wu, B.H., Wang, Y., Yu, Y., Jiang, F., Sun, H., Jing, F.J., Zhu, Shengfa, Wu, Yanping, Leng, Y.X., Huang, N.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 34
container_issue
container_start_page 27
container_title Surface & coatings technology
container_volume 281
creator Wu, B.H.
Wang, Y.
Yu, Y.
Jiang, F.
Sun, H.
Jing, F.J.
Zhu, Shengfa
Wu, Yanping
Leng, Y.X.
Huang, N.
description Due to the large degree of ionization of the sputtered flux and high quality film fabrication, high power pulsed magnetron sputtering (HPPMS) is widely used. However, compared with DC sputtering, low deposition rate is probably the drawback of the HPPMS technique and restricts its application. In order to increase the deposition rate of HPPMS, different combinations of frequency and pulse width at a constant duty cycle were used to modulate the deposition rate of the Ti film. The results showed that wider pulse width would be more effective than increasing frequency on improving titanium deposition rate for a constant duty cycle. The pulse width also would affect the power utilization ratio. Especially for a high duty cycle of 4.8% and 5.6%, a wider pulse was favorable to make full use of power on film deposition, resulting in a higher normalized static deposition rate. Meanwhile, with increase in pulse width for a constant duty cycle, adatom mobility and the deposition rate increased, contributing to growth of crystallite size and higher surface roughness of Ti thin films. •Modulate the deposition rate through changing the combination of frequency and pulse width.•Wider pulse width is beneficial for improving deposition rate at a constant duty cycle.•Wider pulse width induces to the higher normalized static deposition rate at a constant duty cycle.
doi_str_mv 10.1016/j.surfcoat.2015.09.038
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1778027058</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0257897215302760</els_id><sourcerecordid>1778027058</sourcerecordid><originalsourceid>FETCH-LOGICAL-c345t-584a12e058d5e4efc67fcaa16da29ee71931ecbb35fdee87ee8e333815ad25543</originalsourceid><addsrcrecordid>eNqFkEtPAyEQgInRxFr9C4ajl11hWZbdm6bxldR40TOhMNvSbKEFVtN_L7V69jCZZPLN60PompKSEtrcrss4hl57lcqKUF6SriSsPUET2oquYKwWp2hCKi6KthPVObqIcU0IoaKrJ2j36s04qAQ4rQAb2Ppok_UOh2Mt-HG5wnql3NK65Q-k_WZhnfqhfI_7ALsRnN5j5QzejkME_GVNWmGVMutiUi5hM6Y91ns9wCU661WGrn7zFH08PrzPnov529PL7H5eaFbzVPC2VrQCwlvDoYZeN6LXStHGqKoDELRjFPRiwXhvAFqRAxhjLeXKVJzXbIpujnO3wecDY5IbGzUMg3LgxyipEC2pRF6Q0eaI6uBjDNDLbbAbFfaSEnlwLNfyz7E8OJakk9lxbrw7NkJ-5NNCkFHb7AKMDaCTNN7-N-IbeCSMQA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1778027058</pqid></control><display><type>article</type><title>Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle</title><source>Elsevier ScienceDirect Journals</source><creator>Wu, B.H. ; Wang, Y. ; Yu, Y. ; Jiang, F. ; Sun, H. ; Jing, F.J. ; Zhu, Shengfa ; Wu, Yanping ; Leng, Y.X. ; Huang, N.</creator><creatorcontrib>Wu, B.H. ; Wang, Y. ; Yu, Y. ; Jiang, F. ; Sun, H. ; Jing, F.J. ; Zhu, Shengfa ; Wu, Yanping ; Leng, Y.X. ; Huang, N.</creatorcontrib><description>Due to the large degree of ionization of the sputtered flux and high quality film fabrication, high power pulsed magnetron sputtering (HPPMS) is widely used. However, compared with DC sputtering, low deposition rate is probably the drawback of the HPPMS technique and restricts its application. In order to increase the deposition rate of HPPMS, different combinations of frequency and pulse width at a constant duty cycle were used to modulate the deposition rate of the Ti film. The results showed that wider pulse width would be more effective than increasing frequency on improving titanium deposition rate for a constant duty cycle. The pulse width also would affect the power utilization ratio. Especially for a high duty cycle of 4.8% and 5.6%, a wider pulse was favorable to make full use of power on film deposition, resulting in a higher normalized static deposition rate. Meanwhile, with increase in pulse width for a constant duty cycle, adatom mobility and the deposition rate increased, contributing to growth of crystallite size and higher surface roughness of Ti thin films. •Modulate the deposition rate through changing the combination of frequency and pulse width.•Wider pulse width is beneficial for improving deposition rate at a constant duty cycle.•Wider pulse width induces to the higher normalized static deposition rate at a constant duty cycle.</description><identifier>ISSN: 0257-8972</identifier><identifier>EISSN: 1879-3347</identifier><identifier>DOI: 10.1016/j.surfcoat.2015.09.038</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Constants ; Crystallites ; Deposition ; Duty cycle ; Flux ; Frequency ; High power pulsed magnetron sputtering (HPPMS) ; Normalized static deposition rate ; Pulse width ; Surface roughness ; Thin films ; Titanium</subject><ispartof>Surface &amp; coatings technology, 2015-11, Vol.281, p.27-34</ispartof><rights>2015 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c345t-584a12e058d5e4efc67fcaa16da29ee71931ecbb35fdee87ee8e333815ad25543</citedby><cites>FETCH-LOGICAL-c345t-584a12e058d5e4efc67fcaa16da29ee71931ecbb35fdee87ee8e333815ad25543</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.surfcoat.2015.09.038$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,45974</link.rule.ids></links><search><creatorcontrib>Wu, B.H.</creatorcontrib><creatorcontrib>Wang, Y.</creatorcontrib><creatorcontrib>Yu, Y.</creatorcontrib><creatorcontrib>Jiang, F.</creatorcontrib><creatorcontrib>Sun, H.</creatorcontrib><creatorcontrib>Jing, F.J.</creatorcontrib><creatorcontrib>Zhu, Shengfa</creatorcontrib><creatorcontrib>Wu, Yanping</creatorcontrib><creatorcontrib>Leng, Y.X.</creatorcontrib><creatorcontrib>Huang, N.</creatorcontrib><title>Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle</title><title>Surface &amp; coatings technology</title><description>Due to the large degree of ionization of the sputtered flux and high quality film fabrication, high power pulsed magnetron sputtering (HPPMS) is widely used. However, compared with DC sputtering, low deposition rate is probably the drawback of the HPPMS technique and restricts its application. In order to increase the deposition rate of HPPMS, different combinations of frequency and pulse width at a constant duty cycle were used to modulate the deposition rate of the Ti film. The results showed that wider pulse width would be more effective than increasing frequency on improving titanium deposition rate for a constant duty cycle. The pulse width also would affect the power utilization ratio. Especially for a high duty cycle of 4.8% and 5.6%, a wider pulse was favorable to make full use of power on film deposition, resulting in a higher normalized static deposition rate. Meanwhile, with increase in pulse width for a constant duty cycle, adatom mobility and the deposition rate increased, contributing to growth of crystallite size and higher surface roughness of Ti thin films. •Modulate the deposition rate through changing the combination of frequency and pulse width.•Wider pulse width is beneficial for improving deposition rate at a constant duty cycle.•Wider pulse width induces to the higher normalized static deposition rate at a constant duty cycle.</description><subject>Constants</subject><subject>Crystallites</subject><subject>Deposition</subject><subject>Duty cycle</subject><subject>Flux</subject><subject>Frequency</subject><subject>High power pulsed magnetron sputtering (HPPMS)</subject><subject>Normalized static deposition rate</subject><subject>Pulse width</subject><subject>Surface roughness</subject><subject>Thin films</subject><subject>Titanium</subject><issn>0257-8972</issn><issn>1879-3347</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkEtPAyEQgInRxFr9C4ajl11hWZbdm6bxldR40TOhMNvSbKEFVtN_L7V69jCZZPLN60PompKSEtrcrss4hl57lcqKUF6SriSsPUET2oquYKwWp2hCKi6KthPVObqIcU0IoaKrJ2j36s04qAQ4rQAb2Ppok_UOh2Mt-HG5wnql3NK65Q-k_WZhnfqhfI_7ALsRnN5j5QzejkME_GVNWmGVMutiUi5hM6Y91ns9wCU661WGrn7zFH08PrzPnov529PL7H5eaFbzVPC2VrQCwlvDoYZeN6LXStHGqKoDELRjFPRiwXhvAFqRAxhjLeXKVJzXbIpujnO3wecDY5IbGzUMg3LgxyipEC2pRF6Q0eaI6uBjDNDLbbAbFfaSEnlwLNfyz7E8OJakk9lxbrw7NkJ-5NNCkFHb7AKMDaCTNN7-N-IbeCSMQA</recordid><startdate>20151115</startdate><enddate>20151115</enddate><creator>Wu, B.H.</creator><creator>Wang, Y.</creator><creator>Yu, Y.</creator><creator>Jiang, F.</creator><creator>Sun, H.</creator><creator>Jing, F.J.</creator><creator>Zhu, Shengfa</creator><creator>Wu, Yanping</creator><creator>Leng, Y.X.</creator><creator>Huang, N.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20151115</creationdate><title>Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle</title><author>Wu, B.H. ; Wang, Y. ; Yu, Y. ; Jiang, F. ; Sun, H. ; Jing, F.J. ; Zhu, Shengfa ; Wu, Yanping ; Leng, Y.X. ; Huang, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c345t-584a12e058d5e4efc67fcaa16da29ee71931ecbb35fdee87ee8e333815ad25543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Constants</topic><topic>Crystallites</topic><topic>Deposition</topic><topic>Duty cycle</topic><topic>Flux</topic><topic>Frequency</topic><topic>High power pulsed magnetron sputtering (HPPMS)</topic><topic>Normalized static deposition rate</topic><topic>Pulse width</topic><topic>Surface roughness</topic><topic>Thin films</topic><topic>Titanium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, B.H.</creatorcontrib><creatorcontrib>Wang, Y.</creatorcontrib><creatorcontrib>Yu, Y.</creatorcontrib><creatorcontrib>Jiang, F.</creatorcontrib><creatorcontrib>Sun, H.</creatorcontrib><creatorcontrib>Jing, F.J.</creatorcontrib><creatorcontrib>Zhu, Shengfa</creatorcontrib><creatorcontrib>Wu, Yanping</creatorcontrib><creatorcontrib>Leng, Y.X.</creatorcontrib><creatorcontrib>Huang, N.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Surface &amp; coatings technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wu, B.H.</au><au>Wang, Y.</au><au>Yu, Y.</au><au>Jiang, F.</au><au>Sun, H.</au><au>Jing, F.J.</au><au>Zhu, Shengfa</au><au>Wu, Yanping</au><au>Leng, Y.X.</au><au>Huang, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle</atitle><jtitle>Surface &amp; coatings technology</jtitle><date>2015-11-15</date><risdate>2015</risdate><volume>281</volume><spage>27</spage><epage>34</epage><pages>27-34</pages><issn>0257-8972</issn><eissn>1879-3347</eissn><abstract>Due to the large degree of ionization of the sputtered flux and high quality film fabrication, high power pulsed magnetron sputtering (HPPMS) is widely used. However, compared with DC sputtering, low deposition rate is probably the drawback of the HPPMS technique and restricts its application. In order to increase the deposition rate of HPPMS, different combinations of frequency and pulse width at a constant duty cycle were used to modulate the deposition rate of the Ti film. The results showed that wider pulse width would be more effective than increasing frequency on improving titanium deposition rate for a constant duty cycle. The pulse width also would affect the power utilization ratio. Especially for a high duty cycle of 4.8% and 5.6%, a wider pulse was favorable to make full use of power on film deposition, resulting in a higher normalized static deposition rate. Meanwhile, with increase in pulse width for a constant duty cycle, adatom mobility and the deposition rate increased, contributing to growth of crystallite size and higher surface roughness of Ti thin films. •Modulate the deposition rate through changing the combination of frequency and pulse width.•Wider pulse width is beneficial for improving deposition rate at a constant duty cycle.•Wider pulse width induces to the higher normalized static deposition rate at a constant duty cycle.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.surfcoat.2015.09.038</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0257-8972
ispartof Surface & coatings technology, 2015-11, Vol.281, p.27-34
issn 0257-8972
1879-3347
language eng
recordid cdi_proquest_miscellaneous_1778027058
source Elsevier ScienceDirect Journals
subjects Constants
Crystallites
Deposition
Duty cycle
Flux
Frequency
High power pulsed magnetron sputtering (HPPMS)
Normalized static deposition rate
Pulse width
Surface roughness
Thin films
Titanium
title Modulate the deposition rate through changing the combination of frequency and pulse width at constant duty cycle
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T00%3A30%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Modulate%20the%20deposition%20rate%20through%20changing%20the%20combination%20of%20frequency%20and%20pulse%20width%20at%20constant%20duty%20cycle&rft.jtitle=Surface%20&%20coatings%20technology&rft.au=Wu,%20B.H.&rft.date=2015-11-15&rft.volume=281&rft.spage=27&rft.epage=34&rft.pages=27-34&rft.issn=0257-8972&rft.eissn=1879-3347&rft_id=info:doi/10.1016/j.surfcoat.2015.09.038&rft_dat=%3Cproquest_cross%3E1778027058%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1778027058&rft_id=info:pmid/&rft_els_id=S0257897215302760&rfr_iscdi=true