Nitric oxide assisted C sub(60) secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers

Rationale Secondary ion mass spectrometry (SIMS) with polyatomic primary ions provides a successful tool for molecular depth profiling of polymer systems, relevant in many technological applications. Widespread C sub(60) sources, however, cause in some polymers extensive damage with loss of molecula...

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Veröffentlicht in:	Rapid communications in mass spectrometry 2015-12, Vol.29 (23), p.2204-2210
Hauptverfasser:	Zappala, G, Motta, V, Tuccitto, N, Vitale, S, Torrisi, A, Licciardello, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Buckminsterfullerene Damage Depth profiling Fullerenes Polyelectrolytes Scavengers Secondary ion mass spectrometry
Online-Zugang:	Volltext
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