Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy
Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular in...
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Veröffentlicht in: | Nano letters 2015-04, Vol.15 (4), p.2257-2262 |
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creator | Moreno, César Stetsovych, Oleksandr Shimizu, Tomoko K Custance, Oscar |
description | Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. |
doi_str_mv | 10.1021/nl504182w |
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The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution.</description><subject>Atomic force microscopy</subject><subject>Atomic structure</subject><subject>Buckminsterfullerene</subject><subject>Charge distribution</subject><subject>Crystallography - methods</subject><subject>Dynamics</subject><subject>Equipment Design</subject><subject>Equipment Failure Analysis</subject><subject>Fullerenes</subject><subject>Fullerenes - chemistry</subject><subject>Image Enhancement - instrumentation</subject><subject>Imaging</subject><subject>Imaging, Three-Dimensional - instrumentation</subject><subject>Microscopy, Atomic Force - instrumentation</subject><subject>Molecular Conformation</subject><subject>Molecular Imaging - instrumentation</subject><subject>Molecular Probe Techniques - instrumentation</subject><subject>Reproducibility of Results</subject><subject>Sensitivity and Specificity</subject><subject>Three dimensional</subject><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqFkE1Lw0AQhhdRbK0e_AOSi6CH6OxuNtkci99QKWg9h81m0qYk2bqbUPrv3dLak-BphuF5X5iHkEsKdxQYvW9rARGVbH1EhlRwCOM0ZceHXUYDcubcEgBSLuCUDJhIRMzSZEjUW6PmVTsPZguLGD5WDbauMq2qg8_elkpjMM2XqDsXrKtu4Y95Y2rUfa1s8IHO1H3n8SDfBOPONJUOno31ofdKW-O0WW3OyUmpaocX-zkiX89Ps4fXcDJ9eXsYT0LFI9mFJaiCclkI5KooBChFU8kxAc1VKakGqhEiybSGPMaUypzFMs9zKQFLDYqPyM2ud2XNd4-uy5rKaaxr1aLpXUaTmEEcMSH-R-OEQco4B4_e7tDtO85ima1s1Si7yShkW_nZQb5nr_a1XhIWB_LXtgeud4DSLlua3nrN7o-iHwxjjCo</recordid><startdate>20150408</startdate><enddate>20150408</enddate><creator>Moreno, César</creator><creator>Stetsovych, Oleksandr</creator><creator>Shimizu, Tomoko K</creator><creator>Custance, Oscar</creator><general>American Chemical Society</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20150408</creationdate><title>Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy</title><author>Moreno, César ; Stetsovych, Oleksandr ; Shimizu, Tomoko K ; Custance, Oscar</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a348t-f0ad138d5e3add50aa1983e70c3af81c01ce0482cc0b6e918b268bbb880efc0a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Atomic force microscopy</topic><topic>Atomic structure</topic><topic>Buckminsterfullerene</topic><topic>Charge distribution</topic><topic>Crystallography - methods</topic><topic>Dynamics</topic><topic>Equipment Design</topic><topic>Equipment Failure Analysis</topic><topic>Fullerenes</topic><topic>Fullerenes - chemistry</topic><topic>Image Enhancement - instrumentation</topic><topic>Imaging</topic><topic>Imaging, Three-Dimensional - instrumentation</topic><topic>Microscopy, Atomic Force - instrumentation</topic><topic>Molecular Conformation</topic><topic>Molecular Imaging - instrumentation</topic><topic>Molecular Probe Techniques - instrumentation</topic><topic>Reproducibility of Results</topic><topic>Sensitivity and Specificity</topic><topic>Three dimensional</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Moreno, César</creatorcontrib><creatorcontrib>Stetsovych, Oleksandr</creatorcontrib><creatorcontrib>Shimizu, Tomoko K</creatorcontrib><creatorcontrib>Custance, Oscar</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Moreno, César</au><au>Stetsovych, Oleksandr</au><au>Shimizu, Tomoko K</au><au>Custance, Oscar</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2015-04-08</date><risdate>2015</risdate><volume>15</volume><issue>4</issue><spage>2257</spage><epage>2262</epage><pages>2257-2262</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. 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subjects | Atomic force microscopy Atomic structure Buckminsterfullerene Charge distribution Crystallography - methods Dynamics Equipment Design Equipment Failure Analysis Fullerenes Fullerenes - chemistry Image Enhancement - instrumentation Imaging Imaging, Three-Dimensional - instrumentation Microscopy, Atomic Force - instrumentation Molecular Conformation Molecular Imaging - instrumentation Molecular Probe Techniques - instrumentation Reproducibility of Results Sensitivity and Specificity Three dimensional |
title | Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy |
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