To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction

Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweepi...

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Veröffentlicht in:Ultramicroscopy 2013-10, Vol.133, p.35-40
Hauptverfasser: Sojka, Falko, Meissner, Matthias, Zwick, Christian, Forker, Roman, Vyshnepolsky, Michael, Klein, Claudius, Horn-von Hoegen, Michael, Fritz, Torsten
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container_end_page 40
container_issue
container_start_page 35
container_title Ultramicroscopy
container_volume 133
creator Sojka, Falko
Meissner, Matthias
Zwick, Christian
Forker, Roman
Vyshnepolsky, Michael
Klein, Claudius
Horn-von Hoegen, Michael
Fritz, Torsten
description Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweeping E to observe higher diffraction orders decisively enhancing the quantitative examination. Yet, in many cases, such as molecular films with rather large unit cells, the adsorbate reflexes become less pronounced at energies high enough to observe substrate reflexes. One possibility to overcome this problem is an intentional inclination of the sample surface during the measurement at the expense of the quantitative interpretability of then severely distorted diffraction patterns. Here, we introduce a correction method for the axially symmetric distortion in LEED images of tilted samples. We provide experimental confirmation for micro-channel plate LEED and spot-profile analysis LEED instruments using the (7×7) reconstructed surface of a Si(111) single crystal as a reference sample. Finally, we demonstrate that the correction of this distortion considerably improves the quantitative analysis of diffraction patterns of adsorbates since substrate and adsorbate reflexes can be evaluated simultaneously. As an illustrative example we have chosen an epitaxial monolayer of 3,4,9,10-perylenetetracarboxylic dianhydride on Ag(111) that is known to form a commensurate superstructure. •We introduce a method to correct distortions in LEED patterns of tilted surfaces.•Higher diffraction orders unobservable at higher beam energies can be evaluated.•Our procedure makes LEED patterns of tilted samples quantitatively analyzable.•Experimental confirmation with SPA-LEED and MCP-LEED is presented.•The method is applied to PTCDA on Ag(111) confirming earlier literature values.
doi_str_mv 10.1016/j.ultramic.2013.04.005
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subjects Adsorbates
Camber
Crystallization - methods
Diffraction patterns
Distortion
Distortion correction
Electrons
Epitaxy
Low energy electron diffraction
Micro-channel plate LEED (MCP-LEED)
Microscopy, Electron, Transmission - methods
Off-axis
Reflexes
Spot-profile analysis low-energy electron diffraction (SPA-LEED)
Surface Properties
Tilt
Tilted samples
title To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
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