To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweepi...
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Veröffentlicht in: | Ultramicroscopy 2013-10, Vol.133, p.35-40 |
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description | Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweeping E to observe higher diffraction orders decisively enhancing the quantitative examination. Yet, in many cases, such as molecular films with rather large unit cells, the adsorbate reflexes become less pronounced at energies high enough to observe substrate reflexes. One possibility to overcome this problem is an intentional inclination of the sample surface during the measurement at the expense of the quantitative interpretability of then severely distorted diffraction patterns. Here, we introduce a correction method for the axially symmetric distortion in LEED images of tilted samples. We provide experimental confirmation for micro-channel plate LEED and spot-profile analysis LEED instruments using the (7×7) reconstructed surface of a Si(111) single crystal as a reference sample. Finally, we demonstrate that the correction of this distortion considerably improves the quantitative analysis of diffraction patterns of adsorbates since substrate and adsorbate reflexes can be evaluated simultaneously. As an illustrative example we have chosen an epitaxial monolayer of 3,4,9,10-perylenetetracarboxylic dianhydride on Ag(111) that is known to form a commensurate superstructure.
•We introduce a method to correct distortions in LEED patterns of tilted surfaces.•Higher diffraction orders unobservable at higher beam energies can be evaluated.•Our procedure makes LEED patterns of tilted samples quantitatively analyzable.•Experimental confirmation with SPA-LEED and MCP-LEED is presented.•The method is applied to PTCDA on Ag(111) confirming earlier literature values. |
doi_str_mv | 10.1016/j.ultramic.2013.04.005 |
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•We introduce a method to correct distortions in LEED patterns of tilted surfaces.•Higher diffraction orders unobservable at higher beam energies can be evaluated.•Our procedure makes LEED patterns of tilted samples quantitatively analyzable.•Experimental confirmation with SPA-LEED and MCP-LEED is presented.•The method is applied to PTCDA on Ag(111) confirming earlier literature values.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/j.ultramic.2013.04.005</identifier><identifier>PMID: 23770540</identifier><language>eng</language><publisher>Netherlands: Elsevier B.V</publisher><subject>Adsorbates ; Camber ; Crystallization - methods ; Diffraction patterns ; Distortion ; Distortion correction ; Electrons ; Epitaxy ; Low energy electron diffraction ; Micro-channel plate LEED (MCP-LEED) ; Microscopy, Electron, Transmission - methods ; Off-axis ; Reflexes ; Spot-profile analysis low-energy electron diffraction (SPA-LEED) ; Surface Properties ; Tilt ; Tilted samples</subject><ispartof>Ultramicroscopy, 2013-10, Vol.133, p.35-40</ispartof><rights>2013 Elsevier B.V.</rights><rights>Copyright © 2013 Elsevier B.V. All rights reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c401t-d86b22bf34b4244d056dec4dd5ed3575e9cc240e0128bd5e4e02980a2ffc10d03</citedby><cites>FETCH-LOGICAL-c401t-d86b22bf34b4244d056dec4dd5ed3575e9cc240e0128bd5e4e02980a2ffc10d03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ultramic.2013.04.005$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3548,27922,27923,45993</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/23770540$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sojka, Falko</creatorcontrib><creatorcontrib>Meissner, Matthias</creatorcontrib><creatorcontrib>Zwick, Christian</creatorcontrib><creatorcontrib>Forker, Roman</creatorcontrib><creatorcontrib>Vyshnepolsky, Michael</creatorcontrib><creatorcontrib>Klein, Claudius</creatorcontrib><creatorcontrib>Horn-von Hoegen, Michael</creatorcontrib><creatorcontrib>Fritz, Torsten</creatorcontrib><title>To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction</title><title>Ultramicroscopy</title><addtitle>Ultramicroscopy</addtitle><description>Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweeping E to observe higher diffraction orders decisively enhancing the quantitative examination. Yet, in many cases, such as molecular films with rather large unit cells, the adsorbate reflexes become less pronounced at energies high enough to observe substrate reflexes. One possibility to overcome this problem is an intentional inclination of the sample surface during the measurement at the expense of the quantitative interpretability of then severely distorted diffraction patterns. Here, we introduce a correction method for the axially symmetric distortion in LEED images of tilted samples. We provide experimental confirmation for micro-channel plate LEED and spot-profile analysis LEED instruments using the (7×7) reconstructed surface of a Si(111) single crystal as a reference sample. Finally, we demonstrate that the correction of this distortion considerably improves the quantitative analysis of diffraction patterns of adsorbates since substrate and adsorbate reflexes can be evaluated simultaneously. As an illustrative example we have chosen an epitaxial monolayer of 3,4,9,10-perylenetetracarboxylic dianhydride on Ag(111) that is known to form a commensurate superstructure.
•We introduce a method to correct distortions in LEED patterns of tilted surfaces.•Higher diffraction orders unobservable at higher beam energies can be evaluated.•Our procedure makes LEED patterns of tilted samples quantitatively analyzable.•Experimental confirmation with SPA-LEED and MCP-LEED is presented.•The method is applied to PTCDA on Ag(111) confirming earlier literature values.</description><subject>Adsorbates</subject><subject>Camber</subject><subject>Crystallization - methods</subject><subject>Diffraction patterns</subject><subject>Distortion</subject><subject>Distortion correction</subject><subject>Electrons</subject><subject>Epitaxy</subject><subject>Low energy electron diffraction</subject><subject>Micro-channel plate LEED (MCP-LEED)</subject><subject>Microscopy, Electron, Transmission - methods</subject><subject>Off-axis</subject><subject>Reflexes</subject><subject>Spot-profile analysis low-energy electron diffraction (SPA-LEED)</subject><subject>Surface Properties</subject><subject>Tilt</subject><subject>Tilted samples</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqFkctuFDEQRS0EIpPHL0ResulO-dEvVqBRSJAisQlry22XwaPu9mC7QcPX48kkbLNyuereW1IdQq4Z1AxYe7Or1ylHPXtTc2CiBlkDNG_IhvXdUPGOi7dkAwJkJYaBnZHzlHYAwED278kZF10HjYQN-fsYaPZTpiHSJWSaT9-PdBtiRJN9WGhwNP9Ean3KIT51jF4TWjoeqF_M5JdSJz3vJ6RpjU4bTGVAp_CnwgXjjwPFqWTF4rTeuaifci_JO6enhFfP7wX5_uX2cXtfPXy7-7r9_FAZCSxXtm9Hzkcn5Ci5lBaa1qKR1jZoRdM1OBjDJSAw3o-lKRH40IPmzhkGFsQF-XDK3cfwa8WU1eyTwWnSC4Y1Kda1vIT2IF6XSsFa1rRDX6TtSWpiSCmiU_voZx0PioE6IlI79YJIHREpkKogKsbr5x3rOKP9b3thUgSfTgIsR_ntMapkPC4GrT8SUTb413b8A7Q3p3E</recordid><startdate>20131001</startdate><enddate>20131001</enddate><creator>Sojka, Falko</creator><creator>Meissner, Matthias</creator><creator>Zwick, Christian</creator><creator>Forker, Roman</creator><creator>Vyshnepolsky, Michael</creator><creator>Klein, Claudius</creator><creator>Horn-von Hoegen, Michael</creator><creator>Fritz, Torsten</creator><general>Elsevier B.V</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20131001</creationdate><title>To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction</title><author>Sojka, Falko ; Meissner, Matthias ; Zwick, Christian ; Forker, Roman ; Vyshnepolsky, Michael ; Klein, Claudius ; Horn-von Hoegen, Michael ; Fritz, Torsten</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c401t-d86b22bf34b4244d056dec4dd5ed3575e9cc240e0128bd5e4e02980a2ffc10d03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Adsorbates</topic><topic>Camber</topic><topic>Crystallization - methods</topic><topic>Diffraction patterns</topic><topic>Distortion</topic><topic>Distortion correction</topic><topic>Electrons</topic><topic>Epitaxy</topic><topic>Low energy electron diffraction</topic><topic>Micro-channel plate LEED (MCP-LEED)</topic><topic>Microscopy, Electron, Transmission - methods</topic><topic>Off-axis</topic><topic>Reflexes</topic><topic>Spot-profile analysis low-energy electron diffraction (SPA-LEED)</topic><topic>Surface Properties</topic><topic>Tilt</topic><topic>Tilted samples</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sojka, Falko</creatorcontrib><creatorcontrib>Meissner, Matthias</creatorcontrib><creatorcontrib>Zwick, Christian</creatorcontrib><creatorcontrib>Forker, Roman</creatorcontrib><creatorcontrib>Vyshnepolsky, Michael</creatorcontrib><creatorcontrib>Klein, Claudius</creatorcontrib><creatorcontrib>Horn-von Hoegen, Michael</creatorcontrib><creatorcontrib>Fritz, Torsten</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sojka, Falko</au><au>Meissner, Matthias</au><au>Zwick, Christian</au><au>Forker, Roman</au><au>Vyshnepolsky, Michael</au><au>Klein, Claudius</au><au>Horn-von Hoegen, Michael</au><au>Fritz, Torsten</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2013-10-01</date><risdate>2013</risdate><volume>133</volume><spage>35</spage><epage>40</epage><pages>35-40</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><abstract>Low-energy electron diffraction (LEED) is a widely employed technique for the structural characterization of crystalline surfaces and epitaxial adsorbates. For technical reasons the accessible reciprocal space is limited at a given primary electron energy E. This limitation may be overcome by sweeping E to observe higher diffraction orders decisively enhancing the quantitative examination. Yet, in many cases, such as molecular films with rather large unit cells, the adsorbate reflexes become less pronounced at energies high enough to observe substrate reflexes. One possibility to overcome this problem is an intentional inclination of the sample surface during the measurement at the expense of the quantitative interpretability of then severely distorted diffraction patterns. Here, we introduce a correction method for the axially symmetric distortion in LEED images of tilted samples. We provide experimental confirmation for micro-channel plate LEED and spot-profile analysis LEED instruments using the (7×7) reconstructed surface of a Si(111) single crystal as a reference sample. Finally, we demonstrate that the correction of this distortion considerably improves the quantitative analysis of diffraction patterns of adsorbates since substrate and adsorbate reflexes can be evaluated simultaneously. As an illustrative example we have chosen an epitaxial monolayer of 3,4,9,10-perylenetetracarboxylic dianhydride on Ag(111) that is known to form a commensurate superstructure.
•We introduce a method to correct distortions in LEED patterns of tilted surfaces.•Higher diffraction orders unobservable at higher beam energies can be evaluated.•Our procedure makes LEED patterns of tilted samples quantitatively analyzable.•Experimental confirmation with SPA-LEED and MCP-LEED is presented.•The method is applied to PTCDA on Ag(111) confirming earlier literature values.</abstract><cop>Netherlands</cop><pub>Elsevier B.V</pub><pmid>23770540</pmid><doi>10.1016/j.ultramic.2013.04.005</doi><tpages>6</tpages></addata></record> |
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subjects | Adsorbates Camber Crystallization - methods Diffraction patterns Distortion Distortion correction Electrons Epitaxy Low energy electron diffraction Micro-channel plate LEED (MCP-LEED) Microscopy, Electron, Transmission - methods Off-axis Reflexes Spot-profile analysis low-energy electron diffraction (SPA-LEED) Surface Properties Tilt Tilted samples |
title | To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction |
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