Spin Polarization Measurement of Homogeneously Doped Fe sub(1-x)Co sub(x)Si Nanowires by Andreev Reflection Spectroscopy
We report a general method for determining the spin polarization from nanowire materials using Andreev reflection spectroscopy implemented with a Nb superconducting contact and common electron-beam lithography device fabrication techniques. This method was applied to magnetic semiconducting Fe sub(1...
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| Veröffentlicht in: | Nano letters 2011-01, Vol.11 (10), p.4431-4437-4431-4437 |
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| container_end_page | 4437-4431-4437 |
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| container_issue | 10 |
| container_start_page | 4431 |
| container_title | Nano letters |
| container_volume | 11 |
| creator | DeGrave, John P Schmitt, Andrew L Selinsky, Rachel S Higgins, Jeremy M Keavney, David J Jin, Song |
| description | We report a general method for determining the spin polarization from nanowire materials using Andreev reflection spectroscopy implemented with a Nb superconducting contact and common electron-beam lithography device fabrication techniques. This method was applied to magnetic semiconducting Fe sub(1-x)Co sub(x)Si alloy nanowires with x = 0.23, and the average spin polarization extracted from 6 nanowire devices is 28 plus or minus 7% with a highest observed value of 35%. Local-electrode atom probe tomography (APT) confirms the homogeneous distribution of Co atoms in the FeSi host lattice, and X-ray magnetic circular dichroism (XMCD) establishes that the elemental origin of magnetism in this strongly correlated electron system is due to Co atoms. |
| doi_str_mv | 10.1021/nl2026426 |
| format | Article |
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| source | ACS Publications |
| subjects | Cobalt Devices Dichroism Electron beam lithography Nanostructure Nanowires Polarization Reflection Spectroscopy |
| title | Spin Polarization Measurement of Homogeneously Doped Fe sub(1-x)Co sub(x)Si Nanowires by Andreev Reflection Spectroscopy |
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