Low temperature growth of cobalt on Cr2O3(0 0 0 1)

The thickness and temperature dependence of in situ grown cobalt thin films on Cr2O3(0 0 0 1) single crystalline substrate has been studied by low energy electron microscopy (LEEM). The LEEM images indicate that growth of thin Co films ( 5 monolayers) on chromia at 100 K tends to be continuous and f...

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Veröffentlicht in:	Journal of physics. Condensed matter 2016-02, Vol.28 (4), p.046002-046002
Hauptverfasser:	Cao, Shi, Zhang, Xin, Komesu, Takashi, Chen, Gong, Schmid, Andrea K, Yue, Lanping, Tanabe, Iori, Echtenkamp, William, Wang, Yi, Binek, Christian, Dowben, P A
Format:	Artikel
Sprache:	eng
Schlagworte:	chromia cobalt film growth low energy electron microscopy thin film structure and morphology
Online-Zugang:	Volltext
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