Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole
The interaction between screw dislocations and two asymmetrical interfacial cracks emanating from an elliptic hole under loads at infinity is studied. The closed-form solution is derived for complex potentials. The stress intensity factor and the critical applied stress for the dislocation emission...
Gespeichert in:
| Veröffentlicht in: | Chinese physics B 2013, Vol.22 (1), p.356-362 |
|---|---|
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 362 |
|---|---|
| container_issue | 1 |
| container_start_page | 356 |
| container_title | Chinese physics B |
| container_volume | 22 |
| creator | 曾鑫 方棋洪 刘又文 R H. Wen |
| description | The interaction between screw dislocations and two asymmetrical interfacial cracks emanating from an elliptic hole under loads at infinity is studied. The closed-form solution is derived for complex potentials. The stress intensity factor and the critical applied stress for the dislocation emission are also calculated. In the limiting cases, well-known results can be obtained from the present solutions. Moreover, new exact solutions for a screw dislocation interacting with some complicated cracks are derived. The results show that the shielding effect increases with the increase in the length of the other cracks and the minor semi axis, but decreases with the increase of dislocation azimuth. The repulsion acting on the dislocation from the other phase and the other crack extend in the horizontal direction, which makes the dislocation emission at the crack tip take place more easily, but the minor semi axis of the elliptical hole extending in the vertical direction makes it more difficult. |
| doi_str_mv | 10.1088/1674-1056/22/1/014601 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1753494864</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>44445144</cqvip_id><sourcerecordid>1753494864</sourcerecordid><originalsourceid>FETCH-LOGICAL-c312t-1527fe5ffa0d6b63f9b0906ea8f310d14f31ff2171498a11414a1c040b8e11b93</originalsourceid><addsrcrecordid>eNo9kE1PwzAMhiMEEmPwE5DKjUtpnKRtekQTX9IkDsA5SrNkC7TNlmSa9u_J1mm-2IfntewHoXvAT4A5L6CqWQ64rApCCigwsArDBZoQXPKccsou0eTMXKObEH4xrgATOkH2S3m9yxY2dE7JaN0QMjtE7aWKdlhmOxtXWdy5TIZ93-vorZLdSBipbJpVQv9Cpns5yGPEeNdncsh019l1PPIr1-lbdGVkF_TdqU_Rz-vL9-w9n3--fcye57miQGIOJamNLo2ReFG1FTVNixtcackNBbwAlpoxBGpgDZcADJgEhRluuQZoGzpFj-PetXebrQ5R9DaodIwctNsGAXVJWcN4xRJajqjyLgSvjVh720u_F4DFQa04aBMHbYIQAWJUm3IPp9zKDctNevocZKlKYIz-A7yUePA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1753494864</pqid></control><display><type>article</type><title>Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole</title><source>IOP Publishing Journals</source><creator>曾鑫 方棋洪 刘又文 R H. Wen</creator><creatorcontrib>曾鑫 方棋洪 刘又文 R H. Wen</creatorcontrib><description>The interaction between screw dislocations and two asymmetrical interfacial cracks emanating from an elliptic hole under loads at infinity is studied. The closed-form solution is derived for complex potentials. The stress intensity factor and the critical applied stress for the dislocation emission are also calculated. In the limiting cases, well-known results can be obtained from the present solutions. Moreover, new exact solutions for a screw dislocation interacting with some complicated cracks are derived. The results show that the shielding effect increases with the increase in the length of the other cracks and the minor semi axis, but decreases with the increase of dislocation azimuth. The repulsion acting on the dislocation from the other phase and the other crack extend in the horizontal direction, which makes the dislocation emission at the crack tip take place more easily, but the minor semi axis of the elliptical hole extending in the vertical direction makes it more difficult.</description><identifier>ISSN: 1674-1056</identifier><identifier>EISSN: 2058-3834</identifier><identifier>EISSN: 1741-4199</identifier><identifier>DOI: 10.1088/1674-1056/22/1/014601</identifier><language>eng</language><subject>Asymmetry ; Cracks ; Dislocations ; Emission ; Exact solutions ; Interfacial cracks ; Mathematical analysis ; Screw dislocations ; Semifabricated products ; 位错发射 ; 屏蔽效果 ; 应力强度 ; 椭圆形 ; 界面裂纹 ; 相互作用 ; 螺型位错 ; 非对称</subject><ispartof>Chinese physics B, 2013, Vol.22 (1), p.356-362</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c312t-1527fe5ffa0d6b63f9b0906ea8f310d14f31ff2171498a11414a1c040b8e11b93</citedby><cites>FETCH-LOGICAL-c312t-1527fe5ffa0d6b63f9b0906ea8f310d14f31ff2171498a11414a1c040b8e11b93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/85823A/85823A.jpg</thumbnail><link.rule.ids>314,780,784,4022,27921,27922,27923</link.rule.ids></links><search><creatorcontrib>曾鑫 方棋洪 刘又文 R H. Wen</creatorcontrib><title>Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole</title><title>Chinese physics B</title><addtitle>Chinese Physics</addtitle><description>The interaction between screw dislocations and two asymmetrical interfacial cracks emanating from an elliptic hole under loads at infinity is studied. The closed-form solution is derived for complex potentials. The stress intensity factor and the critical applied stress for the dislocation emission are also calculated. In the limiting cases, well-known results can be obtained from the present solutions. Moreover, new exact solutions for a screw dislocation interacting with some complicated cracks are derived. The results show that the shielding effect increases with the increase in the length of the other cracks and the minor semi axis, but decreases with the increase of dislocation azimuth. The repulsion acting on the dislocation from the other phase and the other crack extend in the horizontal direction, which makes the dislocation emission at the crack tip take place more easily, but the minor semi axis of the elliptical hole extending in the vertical direction makes it more difficult.</description><subject>Asymmetry</subject><subject>Cracks</subject><subject>Dislocations</subject><subject>Emission</subject><subject>Exact solutions</subject><subject>Interfacial cracks</subject><subject>Mathematical analysis</subject><subject>Screw dislocations</subject><subject>Semifabricated products</subject><subject>位错发射</subject><subject>屏蔽效果</subject><subject>应力强度</subject><subject>椭圆形</subject><subject>界面裂纹</subject><subject>相互作用</subject><subject>螺型位错</subject><subject>非对称</subject><issn>1674-1056</issn><issn>2058-3834</issn><issn>1741-4199</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNo9kE1PwzAMhiMEEmPwE5DKjUtpnKRtekQTX9IkDsA5SrNkC7TNlmSa9u_J1mm-2IfntewHoXvAT4A5L6CqWQ64rApCCigwsArDBZoQXPKccsou0eTMXKObEH4xrgATOkH2S3m9yxY2dE7JaN0QMjtE7aWKdlhmOxtXWdy5TIZ93-vorZLdSBipbJpVQv9Cpns5yGPEeNdncsh019l1PPIr1-lbdGVkF_TdqU_Rz-vL9-w9n3--fcye57miQGIOJamNLo2ReFG1FTVNixtcackNBbwAlpoxBGpgDZcADJgEhRluuQZoGzpFj-PetXebrQ5R9DaodIwctNsGAXVJWcN4xRJajqjyLgSvjVh720u_F4DFQa04aBMHbYIQAWJUm3IPp9zKDctNevocZKlKYIz-A7yUePA</recordid><startdate>2013</startdate><enddate>2013</enddate><creator>曾鑫 方棋洪 刘又文 R H. Wen</creator><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>2013</creationdate><title>Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole</title><author>曾鑫 方棋洪 刘又文 R H. Wen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c312t-1527fe5ffa0d6b63f9b0906ea8f310d14f31ff2171498a11414a1c040b8e11b93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Asymmetry</topic><topic>Cracks</topic><topic>Dislocations</topic><topic>Emission</topic><topic>Exact solutions</topic><topic>Interfacial cracks</topic><topic>Mathematical analysis</topic><topic>Screw dislocations</topic><topic>Semifabricated products</topic><topic>位错发射</topic><topic>屏蔽效果</topic><topic>应力强度</topic><topic>椭圆形</topic><topic>界面裂纹</topic><topic>相互作用</topic><topic>螺型位错</topic><topic>非对称</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>曾鑫 方棋洪 刘又文 R H. Wen</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Chinese physics B</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>曾鑫 方棋洪 刘又文 R H. Wen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole</atitle><jtitle>Chinese physics B</jtitle><addtitle>Chinese Physics</addtitle><date>2013</date><risdate>2013</risdate><volume>22</volume><issue>1</issue><spage>356</spage><epage>362</epage><pages>356-362</pages><issn>1674-1056</issn><eissn>2058-3834</eissn><eissn>1741-4199</eissn><abstract>The interaction between screw dislocations and two asymmetrical interfacial cracks emanating from an elliptic hole under loads at infinity is studied. The closed-form solution is derived for complex potentials. The stress intensity factor and the critical applied stress for the dislocation emission are also calculated. In the limiting cases, well-known results can be obtained from the present solutions. Moreover, new exact solutions for a screw dislocation interacting with some complicated cracks are derived. The results show that the shielding effect increases with the increase in the length of the other cracks and the minor semi axis, but decreases with the increase of dislocation azimuth. The repulsion acting on the dislocation from the other phase and the other crack extend in the horizontal direction, which makes the dislocation emission at the crack tip take place more easily, but the minor semi axis of the elliptical hole extending in the vertical direction makes it more difficult.</abstract><doi>10.1088/1674-1056/22/1/014601</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1674-1056 |
| ispartof | Chinese physics B, 2013, Vol.22 (1), p.356-362 |
| issn | 1674-1056 2058-3834 1741-4199 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1753494864 |
| source | IOP Publishing Journals |
| subjects | Asymmetry Cracks Dislocations Emission Exact solutions Interfacial cracks Mathematical analysis Screw dislocations Semifabricated products 位错发射 屏蔽效果 应力强度 椭圆形 界面裂纹 相互作用 螺型位错 非对称 |
| title | Screw dislocations interacting with two asymmetrical interfacial cracks emanating from an elliptical hole |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T14%3A30%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Screw%20dislocations%20interacting%20with%20two%20asymmetrical%20interfacial%20cracks%20emanating%20from%20an%20elliptical%20hole&rft.jtitle=Chinese%20physics%20B&rft.au=%E6%9B%BE%E9%91%AB%20%E6%96%B9%E6%A3%8B%E6%B4%AA%20%E5%88%98%E5%8F%88%E6%96%87%20R%20H.%20Wen&rft.date=2013&rft.volume=22&rft.issue=1&rft.spage=356&rft.epage=362&rft.pages=356-362&rft.issn=1674-1056&rft.eissn=2058-3834&rft_id=info:doi/10.1088/1674-1056/22/1/014601&rft_dat=%3Cproquest_cross%3E1753494864%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1753494864&rft_id=info:pmid/&rft_cqvip_id=44445144&rfr_iscdi=true |