Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts
Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH...
Gespeichert in:
Veröffentlicht in: | Advanced functional materials 2015-09, Vol.25 (34), p.5504-5511 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5511 |
---|---|
container_issue | 34 |
container_start_page | 5504 |
container_title | Advanced functional materials |
container_volume | 25 |
creator | Belaineh, Dagmawi Tan, Jun-Kai Png, Rui-Qi Dee, Pei-Fang Lee, Yi-Min Thi, Bao-Nguyen Nguyen Ridzuan, Nur-Sabrina Ho, Peter K. H. |
description | Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices.
The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts. |
doi_str_mv | 10.1002/adfm.201500784 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1753492946</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1753492946</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4304-9b7c040bb657347113d0f98d4a10766507fe9fbfed75009194f6692b80c2a21c3</originalsourceid><addsrcrecordid>eNqFkL1PwzAQxSMEEp8rc0aWlHPi2DVbVegHagsSrUAsluPY1CWJi50I-t8TFFSxMd3p7v2e7l4QXCLoIYD4WuS67MWAUgDaxwfBCSKIRAnE_cN9j16Og1PvNwCI0gSfBPJROV001plK1CoPp7aypXLR3OZGm3YwsYWKptVGydrYKpyJnXL-JlwVtRNr87aOnq17103VrbOmDhetxbo0Mhzaqhay9ufBkRaFVxe_9SxYje6Ww0k0exhPh4NZJHECOGIZlYAhy0jankYRSnLQrJ9jgYASkgLViulMq5y2LzLEsCaExVkfZCxiJJOz4Krz3Tr70Shf89J4qYpCVMo2niOaJpjFDJNW2uuk0lnvndJ860wp3I4j4D9p8p80-T7NFmAd8GkKtftHzQe3o_lfNupY42v1tWeFe-eEJjTlz4sxf3qdL8fze8SXyTfRh4kJ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1753492946</pqid></control><display><type>article</type><title>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</title><source>Wiley Journals</source><creator>Belaineh, Dagmawi ; Tan, Jun-Kai ; Png, Rui-Qi ; Dee, Pei-Fang ; Lee, Yi-Min ; Thi, Bao-Nguyen Nguyen ; Ridzuan, Nur-Sabrina ; Ho, Peter K. H.</creator><creatorcontrib>Belaineh, Dagmawi ; Tan, Jun-Kai ; Png, Rui-Qi ; Dee, Pei-Fang ; Lee, Yi-Min ; Thi, Bao-Nguyen Nguyen ; Ridzuan, Nur-Sabrina ; Ho, Peter K. H.</creatorcontrib><description>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices.
The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</description><identifier>ISSN: 1616-301X</identifier><identifier>EISSN: 1616-3028</identifier><identifier>DOI: 10.1002/adfm.201500784</identifier><language>eng</language><publisher>Blackwell Publishing Ltd</publisher><subject>Blends ; Contact resistance ; Density ; Ionization potentials ; Ionomers ; ohmic contact ; Organic semiconductors ; perfluorinated ionomers ; Segregations ; Semiconductors ; Surface layer ; workfunction</subject><ispartof>Advanced functional materials, 2015-09, Vol.25 (34), p.5504-5511</ispartof><rights>2015 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4304-9b7c040bb657347113d0f98d4a10766507fe9fbfed75009194f6692b80c2a21c3</citedby><cites>FETCH-LOGICAL-c4304-9b7c040bb657347113d0f98d4a10766507fe9fbfed75009194f6692b80c2a21c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadfm.201500784$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadfm.201500784$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Belaineh, Dagmawi</creatorcontrib><creatorcontrib>Tan, Jun-Kai</creatorcontrib><creatorcontrib>Png, Rui-Qi</creatorcontrib><creatorcontrib>Dee, Pei-Fang</creatorcontrib><creatorcontrib>Lee, Yi-Min</creatorcontrib><creatorcontrib>Thi, Bao-Nguyen Nguyen</creatorcontrib><creatorcontrib>Ridzuan, Nur-Sabrina</creatorcontrib><creatorcontrib>Ho, Peter K. H.</creatorcontrib><title>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</title><title>Advanced functional materials</title><addtitle>Adv. Funct. Mater</addtitle><description>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices.
The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</description><subject>Blends</subject><subject>Contact resistance</subject><subject>Density</subject><subject>Ionization potentials</subject><subject>Ionomers</subject><subject>ohmic contact</subject><subject>Organic semiconductors</subject><subject>perfluorinated ionomers</subject><subject>Segregations</subject><subject>Semiconductors</subject><subject>Surface layer</subject><subject>workfunction</subject><issn>1616-301X</issn><issn>1616-3028</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkL1PwzAQxSMEEp8rc0aWlHPi2DVbVegHagsSrUAsluPY1CWJi50I-t8TFFSxMd3p7v2e7l4QXCLoIYD4WuS67MWAUgDaxwfBCSKIRAnE_cN9j16Og1PvNwCI0gSfBPJROV001plK1CoPp7aypXLR3OZGm3YwsYWKptVGydrYKpyJnXL-JlwVtRNr87aOnq17103VrbOmDhetxbo0Mhzaqhay9ufBkRaFVxe_9SxYje6Ww0k0exhPh4NZJHECOGIZlYAhy0jankYRSnLQrJ9jgYASkgLViulMq5y2LzLEsCaExVkfZCxiJJOz4Krz3Tr70Shf89J4qYpCVMo2niOaJpjFDJNW2uuk0lnvndJ860wp3I4j4D9p8p80-T7NFmAd8GkKtftHzQe3o_lfNupY42v1tWeFe-eEJjTlz4sxf3qdL8fze8SXyTfRh4kJ</recordid><startdate>20150901</startdate><enddate>20150901</enddate><creator>Belaineh, Dagmawi</creator><creator>Tan, Jun-Kai</creator><creator>Png, Rui-Qi</creator><creator>Dee, Pei-Fang</creator><creator>Lee, Yi-Min</creator><creator>Thi, Bao-Nguyen Nguyen</creator><creator>Ridzuan, Nur-Sabrina</creator><creator>Ho, Peter K. H.</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20150901</creationdate><title>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</title><author>Belaineh, Dagmawi ; Tan, Jun-Kai ; Png, Rui-Qi ; Dee, Pei-Fang ; Lee, Yi-Min ; Thi, Bao-Nguyen Nguyen ; Ridzuan, Nur-Sabrina ; Ho, Peter K. H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4304-9b7c040bb657347113d0f98d4a10766507fe9fbfed75009194f6692b80c2a21c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Blends</topic><topic>Contact resistance</topic><topic>Density</topic><topic>Ionization potentials</topic><topic>Ionomers</topic><topic>ohmic contact</topic><topic>Organic semiconductors</topic><topic>perfluorinated ionomers</topic><topic>Segregations</topic><topic>Semiconductors</topic><topic>Surface layer</topic><topic>workfunction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Belaineh, Dagmawi</creatorcontrib><creatorcontrib>Tan, Jun-Kai</creatorcontrib><creatorcontrib>Png, Rui-Qi</creatorcontrib><creatorcontrib>Dee, Pei-Fang</creatorcontrib><creatorcontrib>Lee, Yi-Min</creatorcontrib><creatorcontrib>Thi, Bao-Nguyen Nguyen</creatorcontrib><creatorcontrib>Ridzuan, Nur-Sabrina</creatorcontrib><creatorcontrib>Ho, Peter K. H.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Advanced functional materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Belaineh, Dagmawi</au><au>Tan, Jun-Kai</au><au>Png, Rui-Qi</au><au>Dee, Pei-Fang</au><au>Lee, Yi-Min</au><au>Thi, Bao-Nguyen Nguyen</au><au>Ridzuan, Nur-Sabrina</au><au>Ho, Peter K. H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</atitle><jtitle>Advanced functional materials</jtitle><addtitle>Adv. Funct. Mater</addtitle><date>2015-09-01</date><risdate>2015</risdate><volume>25</volume><issue>34</issue><spage>5504</spage><epage>5511</epage><pages>5504-5511</pages><issn>1616-301X</issn><eissn>1616-3028</eissn><abstract>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices.
The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</abstract><pub>Blackwell Publishing Ltd</pub><doi>10.1002/adfm.201500784</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1616-301X |
ispartof | Advanced functional materials, 2015-09, Vol.25 (34), p.5504-5511 |
issn | 1616-301X 1616-3028 |
language | eng |
recordid | cdi_proquest_miscellaneous_1753492946 |
source | Wiley Journals |
subjects | Blends Contact resistance Density Ionization potentials Ionomers ohmic contact Organic semiconductors perfluorinated ionomers Segregations Semiconductors Surface layer workfunction |
title | Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T06%3A04%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Perfluorinated%20Ionomer-Modified%20Hole-Injection%20Layers:%20Ultrahigh-Workfunction%20but%20Nonohmic%20Contacts&rft.jtitle=Advanced%20functional%20materials&rft.au=Belaineh,%20Dagmawi&rft.date=2015-09-01&rft.volume=25&rft.issue=34&rft.spage=5504&rft.epage=5511&rft.pages=5504-5511&rft.issn=1616-301X&rft.eissn=1616-3028&rft_id=info:doi/10.1002/adfm.201500784&rft_dat=%3Cproquest_cross%3E1753492946%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1753492946&rft_id=info:pmid/&rfr_iscdi=true |