Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts

Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH...

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Veröffentlicht in:Advanced functional materials 2015-09, Vol.25 (34), p.5504-5511
Hauptverfasser: Belaineh, Dagmawi, Tan, Jun-Kai, Png, Rui-Qi, Dee, Pei-Fang, Lee, Yi-Min, Thi, Bao-Nguyen Nguyen, Ridzuan, Nur-Sabrina, Ho, Peter K. H.
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container_end_page 5511
container_issue 34
container_start_page 5504
container_title Advanced functional materials
container_volume 25
creator Belaineh, Dagmawi
Tan, Jun-Kai
Png, Rui-Qi
Dee, Pei-Fang
Lee, Yi-Min
Thi, Bao-Nguyen Nguyen
Ridzuan, Nur-Sabrina
Ho, Peter K. H.
description Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices. The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.
doi_str_mv 10.1002/adfm.201500784
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H.</creator><creatorcontrib>Belaineh, Dagmawi ; Tan, Jun-Kai ; Png, Rui-Qi ; Dee, Pei-Fang ; Lee, Yi-Min ; Thi, Bao-Nguyen Nguyen ; Ridzuan, Nur-Sabrina ; Ho, Peter K. H.</creatorcontrib><description>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices. The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</description><identifier>ISSN: 1616-301X</identifier><identifier>EISSN: 1616-3028</identifier><identifier>DOI: 10.1002/adfm.201500784</identifier><language>eng</language><publisher>Blackwell Publishing Ltd</publisher><subject>Blends ; Contact resistance ; Density ; Ionization potentials ; Ionomers ; ohmic contact ; Organic semiconductors ; perfluorinated ionomers ; Segregations ; Semiconductors ; Surface layer ; workfunction</subject><ispartof>Advanced functional materials, 2015-09, Vol.25 (34), p.5504-5511</ispartof><rights>2015 WILEY‐VCH Verlag GmbH &amp; Co. 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H.</creatorcontrib><title>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</title><title>Advanced functional materials</title><addtitle>Adv. Funct. Mater</addtitle><description>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. 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The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</description><subject>Blends</subject><subject>Contact resistance</subject><subject>Density</subject><subject>Ionization potentials</subject><subject>Ionomers</subject><subject>ohmic contact</subject><subject>Organic semiconductors</subject><subject>perfluorinated ionomers</subject><subject>Segregations</subject><subject>Semiconductors</subject><subject>Surface layer</subject><subject>workfunction</subject><issn>1616-301X</issn><issn>1616-3028</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkL1PwzAQxSMEEp8rc0aWlHPi2DVbVegHagsSrUAsluPY1CWJi50I-t8TFFSxMd3p7v2e7l4QXCLoIYD4WuS67MWAUgDaxwfBCSKIRAnE_cN9j16Og1PvNwCI0gSfBPJROV001plK1CoPp7aypXLR3OZGm3YwsYWKptVGydrYKpyJnXL-JlwVtRNr87aOnq17103VrbOmDhetxbo0Mhzaqhay9ufBkRaFVxe_9SxYje6Ww0k0exhPh4NZJHECOGIZlYAhy0jankYRSnLQrJ9jgYASkgLViulMq5y2LzLEsCaExVkfZCxiJJOz4Krz3Tr70Shf89J4qYpCVMo2niOaJpjFDJNW2uuk0lnvndJ860wp3I4j4D9p8p80-T7NFmAd8GkKtftHzQe3o_lfNupY42v1tWeFe-eEJjTlz4sxf3qdL8fze8SXyTfRh4kJ</recordid><startdate>20150901</startdate><enddate>20150901</enddate><creator>Belaineh, Dagmawi</creator><creator>Tan, Jun-Kai</creator><creator>Png, Rui-Qi</creator><creator>Dee, Pei-Fang</creator><creator>Lee, Yi-Min</creator><creator>Thi, Bao-Nguyen Nguyen</creator><creator>Ridzuan, Nur-Sabrina</creator><creator>Ho, Peter K. 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H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts</atitle><jtitle>Advanced functional materials</jtitle><addtitle>Adv. Funct. Mater</addtitle><date>2015-09-01</date><risdate>2015</risdate><volume>25</volume><issue>34</issue><spage>5504</spage><epage>5511</epage><pages>5504-5511</pages><issn>1616-301X</issn><eissn>1616-3028</eissn><abstract>Recently it has been reported that Nafion oligomers, i.e., 2‐(2‐sulfonatotetrafluoroethoxy)‐2‐trifluoromethyltrifluoroethoxyfunctionalized oligotetrafluoroethylenes, also called perfluorinated ionomers (PFIs), can be blended into poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDT:PSSH) films to increase their workfunctions beyond 5.2 eV. These PFI‐modified films are useful for energy‐level alignment studies, and have been proposed as hole‐injection layers (HILs). It is shown here however that these HILs do not provide sufficiently fast hole transfer into adjacent polymer semiconductor layers with ionization potentials deeper than ≈5.2 eV. X‐ray and ultraviolet photoemission spectroscopies reveal that these HILs exhibit a molecularly‐thin PFI overlayer that sets up a surface dipole that provides the ultrahigh workfunction. This dipolar layer persists even when the subsequent organic semiconductor layer is deposited, as evidenced by measurements of the diode built‐in potentials. As a consequence, the PFI‐modified HILs produce a higher contact resistance, and a lower equilibrium density of holes at the semiconductor contact than might have been expected from simple thermodynamic considerations of the reduction in hole‐injection barrier. Thus the use of insulating dipolar surface layers at the charge‐injection contact to tune its workfunction to match the relevant transport level of the semiconductor is of limited utility to achieve ohmic contact in these devices. The ultrahigh workfunctions of poly(3,4‐Organic Semiconductors ethylenedioxythiophene):poly(styrenesu lfonic acid) (PEDT:PSSH):perfluorinated ionomer (PFI) blends result from a dipolar surface layer associated with surface segregation of PFI chains. Despite their higher workfunctions, their hole contacts to organic semiconductors with ionization potentials deeper than 5.2 eV remain nonohmic. Work function matching through the use of an insulating dipolar layer is not efficient for providing ohmic contacts.</abstract><pub>Blackwell Publishing Ltd</pub><doi>10.1002/adfm.201500784</doi><tpages>8</tpages></addata></record>
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source Wiley Journals
subjects Blends
Contact resistance
Density
Ionization potentials
Ionomers
ohmic contact
Organic semiconductors
perfluorinated ionomers
Segregations
Semiconductors
Surface layer
workfunction
title Perfluorinated Ionomer-Modified Hole-Injection Layers: Ultrahigh-Workfunction but Nonohmic Contacts
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