Improvement of X-ray stress measurement from a Debye–Scherrer ring by oscillation of the X-ray incident angle

A technique to improve the stress measurement from a Debye–Scherrer ring (D–S ring) is reported. In a previous work, the authors reported a technique to calculate stress from the Fourier series of the normal strain of a D–S ring. That technique, similar to the cosα method that came before it, is ina...

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Veröffentlicht in:Powder diffraction 2015-09, Vol.30 (3), p.250-255
Hauptverfasser: Miyazaki, Toshiyuki, Maruyama, Yoichi, Fujimoto, Yohei, Sasaki, Toshihiko
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creator Miyazaki, Toshiyuki
Maruyama, Yoichi
Fujimoto, Yohei
Sasaki, Toshihiko
description A technique to improve the stress measurement from a Debye–Scherrer ring (D–S ring) is reported. In a previous work, the authors reported a technique to calculate stress from the Fourier series of the normal strain of a D–S ring. That technique, similar to the cosα method that came before it, is inaccurate when the grain size of the specimen is relatively large. To cope with this problem, the authors propose using the oscillation of the X-ray incident angle. The present study demonstrates this technique to improve the stress measurement.
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source Cambridge University Press Journals Complete
subjects Debye Scherrer method
Diffraction
Fourier series
Grain size
Mathematical analysis
Oscillations
Strain
Stress measurement
Technical Articles
X-rays
title Improvement of X-ray stress measurement from a Debye–Scherrer ring by oscillation of the X-ray incident angle
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