A 10 Gsps 8 bit digital-to-analog converter with a built-in self-test circuit

We present a 10 Gsps 8 bit digital-to-analog converter （DAC） with a novel built-in self-test （BIST） circuit, which makes it possible to evaluate the DAC＇s performance without a complicated test setup. Design con- siderations and test results are included. According to the test results, the DAC core...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of semiconductors 2013-12, Vol.34 (12), p.97-101
1. Verfasser:	周磊 吴旦昱 江帆 金智 刘新宇
Format:	Artikel
Sprache:	eng
Schlagworte:	BIST Chip formation Chips Circuits DAC Digital to analog converters Performance evaluation Semiconductors SiGe异质结双极晶体管 Silicon germanides 位数 内置自测试 模拟转换器 测试电路 芯片尺寸
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!