Microstructural and analytical analysis of plasma dissociated zircon
The investigation of the microstructure and distribution of impurities was carried out on plasma dissociated zircon (PDZ). The morphology of the PDZ and crystalline nature of the zirconia was determined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) while energy dis...
Gespeichert in:
| Veröffentlicht in: | Journal of physics. Conference series 2012-01, Vol.371 (1), p.12041-4 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 4 |
|---|---|
| container_issue | 1 |
| container_start_page | 12041 |
| container_title | Journal of physics. Conference series |
| container_volume | 371 |
| creator | Minnaar, E G Neethling, J H Lee, M E Snyders, E |
| description | The investigation of the microstructure and distribution of impurities was carried out on plasma dissociated zircon (PDZ). The morphology of the PDZ and crystalline nature of the zirconia was determined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) while energy dispersive X-ray spectrometry (EDS) provided compositional information. The SEM and TEM results indicate that the morphology and crystalline nature of the zirconia varies as a result of the existence of a thermal gradient. The EDS results show that the majority of the impurities segregates to the silica phase of the PDZ. |
| doi_str_mv | 10.1088/1742-6596/371/1/012041 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1744698726</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1744698726</sourcerecordid><originalsourceid>FETCH-LOGICAL-c311t-1b9f6534778efc63d2424ec69a66dfbd06b2d574328e3a70ce4e58d6edb8c5723</originalsourceid><addsrcrecordid>eNpdkE1LxDAQhoMouFb_ghS8eKnNd9KjrJ-w4kXPIU1SyNLdrpn2sP56U1dEHBjmHeZl4H0QuiT4hmCta6I4raRoZM0UqUmNCcWcHKHF7-H4jz5FZwBrjFkutUB3L9GlAcY0uXFKti_t1ue2_X6M7nvNEiKUQ1fuegsbW_oIMLhox-DLz5jcsD1HJ53tIVz8zAK9P9y_LZ-q1evj8_J2VTlGyFiRtumkYFwpHTonmaec8uBkY6X0XeuxbKkXijOqA7MKu8CD0F4G32onFGUFuj783aXhYwowmk0EF_rebsMwgckhuWy0ojJbr_5Z18OUchgwVChNlGgygwLJg2tmACl0Zpfixqa9IdjMcOeX1MzcTIZriDnAZV9KtGzf</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2578175900</pqid></control><display><type>article</type><title>Microstructural and analytical analysis of plasma dissociated zircon</title><source>IOP Publishing Free Content</source><source>EZB-FREE-00999 freely available EZB journals</source><source>IOPscience extra</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Minnaar, E G ; Neethling, J H ; Lee, M E ; Snyders, E</creator><creatorcontrib>Minnaar, E G ; Neethling, J H ; Lee, M E ; Snyders, E</creatorcontrib><description>The investigation of the microstructure and distribution of impurities was carried out on plasma dissociated zircon (PDZ). The morphology of the PDZ and crystalline nature of the zirconia was determined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) while energy dispersive X-ray spectrometry (EDS) provided compositional information. The SEM and TEM results indicate that the morphology and crystalline nature of the zirconia varies as a result of the existence of a thermal gradient. The EDS results show that the majority of the impurities segregates to the silica phase of the PDZ.</description><identifier>ISSN: 1742-6596</identifier><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/371/1/012041</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Crystal structure ; Crystallinity ; Impurities ; Microstructure ; Morphology ; Physics ; Plasma (physics) ; Scanning electron microscopy ; Silicon dioxide ; Transmission electron microscopy ; Zircon ; Zirconium dioxide</subject><ispartof>Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12041-4</ispartof><rights>Copyright IOP Publishing Jul 2012</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c311t-1b9f6534778efc63d2424ec69a66dfbd06b2d574328e3a70ce4e58d6edb8c5723</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Minnaar, E G</creatorcontrib><creatorcontrib>Neethling, J H</creatorcontrib><creatorcontrib>Lee, M E</creatorcontrib><creatorcontrib>Snyders, E</creatorcontrib><title>Microstructural and analytical analysis of plasma dissociated zircon</title><title>Journal of physics. Conference series</title><description>The investigation of the microstructure and distribution of impurities was carried out on plasma dissociated zircon (PDZ). The morphology of the PDZ and crystalline nature of the zirconia was determined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) while energy dispersive X-ray spectrometry (EDS) provided compositional information. The SEM and TEM results indicate that the morphology and crystalline nature of the zirconia varies as a result of the existence of a thermal gradient. The EDS results show that the majority of the impurities segregates to the silica phase of the PDZ.</description><subject>Crystal structure</subject><subject>Crystallinity</subject><subject>Impurities</subject><subject>Microstructure</subject><subject>Morphology</subject><subject>Physics</subject><subject>Plasma (physics)</subject><subject>Scanning electron microscopy</subject><subject>Silicon dioxide</subject><subject>Transmission electron microscopy</subject><subject>Zircon</subject><subject>Zirconium dioxide</subject><issn>1742-6596</issn><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNpdkE1LxDAQhoMouFb_ghS8eKnNd9KjrJ-w4kXPIU1SyNLdrpn2sP56U1dEHBjmHeZl4H0QuiT4hmCta6I4raRoZM0UqUmNCcWcHKHF7-H4jz5FZwBrjFkutUB3L9GlAcY0uXFKti_t1ue2_X6M7nvNEiKUQ1fuegsbW_oIMLhox-DLz5jcsD1HJ53tIVz8zAK9P9y_LZ-q1evj8_J2VTlGyFiRtumkYFwpHTonmaec8uBkY6X0XeuxbKkXijOqA7MKu8CD0F4G32onFGUFuj783aXhYwowmk0EF_rebsMwgckhuWy0ojJbr_5Z18OUchgwVChNlGgygwLJg2tmACl0Zpfixqa9IdjMcOeX1MzcTIZriDnAZV9KtGzf</recordid><startdate>20120101</startdate><enddate>20120101</enddate><creator>Minnaar, E G</creator><creator>Neethling, J H</creator><creator>Lee, M E</creator><creator>Snyders, E</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>7U5</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>20120101</creationdate><title>Microstructural and analytical analysis of plasma dissociated zircon</title><author>Minnaar, E G ; Neethling, J H ; Lee, M E ; Snyders, E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c311t-1b9f6534778efc63d2424ec69a66dfbd06b2d574328e3a70ce4e58d6edb8c5723</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Crystal structure</topic><topic>Crystallinity</topic><topic>Impurities</topic><topic>Microstructure</topic><topic>Morphology</topic><topic>Physics</topic><topic>Plasma (physics)</topic><topic>Scanning electron microscopy</topic><topic>Silicon dioxide</topic><topic>Transmission electron microscopy</topic><topic>Zircon</topic><topic>Zirconium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Minnaar, E G</creatorcontrib><creatorcontrib>Neethling, J H</creatorcontrib><creatorcontrib>Lee, M E</creatorcontrib><creatorcontrib>Snyders, E</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Minnaar, E G</au><au>Neethling, J H</au><au>Lee, M E</au><au>Snyders, E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructural and analytical analysis of plasma dissociated zircon</atitle><jtitle>Journal of physics. Conference series</jtitle><date>2012-01-01</date><risdate>2012</risdate><volume>371</volume><issue>1</issue><spage>12041</spage><epage>4</epage><pages>12041-4</pages><issn>1742-6596</issn><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>The investigation of the microstructure and distribution of impurities was carried out on plasma dissociated zircon (PDZ). The morphology of the PDZ and crystalline nature of the zirconia was determined by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) while energy dispersive X-ray spectrometry (EDS) provided compositional information. The SEM and TEM results indicate that the morphology and crystalline nature of the zirconia varies as a result of the existence of a thermal gradient. The EDS results show that the majority of the impurities segregates to the silica phase of the PDZ.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/371/1/012041</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1742-6596 |
| ispartof | Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12041-4 |
| issn | 1742-6596 1742-6588 1742-6596 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1744698726 |
| source | IOP Publishing Free Content; EZB-FREE-00999 freely available EZB journals; IOPscience extra; Alma/SFX Local Collection; Free Full-Text Journals in Chemistry |
| subjects | Crystal structure Crystallinity Impurities Microstructure Morphology Physics Plasma (physics) Scanning electron microscopy Silicon dioxide Transmission electron microscopy Zircon Zirconium dioxide |
| title | Microstructural and analytical analysis of plasma dissociated zircon |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T07%3A35%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microstructural%20and%20analytical%20analysis%20of%20plasma%20dissociated%20zircon&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Minnaar,%20E%20G&rft.date=2012-01-01&rft.volume=371&rft.issue=1&rft.spage=12041&rft.epage=4&rft.pages=12041-4&rft.issn=1742-6596&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/371/1/012041&rft_dat=%3Cproquest_cross%3E1744698726%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2578175900&rft_id=info:pmid/&rfr_iscdi=true |