Anomalous temperature-dependent photoluminescence peak energy in InAlN alloys

InAlN has been studied by means of temperature-dependent time-integrated photoluminescence and time-resolved photoluminescence. The variation of PL peak energy did not follow the behavior predicted by Varshni formula, and a faster redshift with increasing temperature was observed. We used a model th...

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Veröffentlicht in:Journal of semiconductors 2014-09, Vol.35 (9), p.93001-1-093001-5
Hauptverfasser: Li, Wei, Jin, Peng, Wang, Weiying, Mao, Defeng, Liu, Guipeng, Wang, Zhanguo, Wang, Jiaming, Xu, Fujun, Shen, Bo
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Sprache:eng
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Zusammenfassung:InAlN has been studied by means of temperature-dependent time-integrated photoluminescence and time-resolved photoluminescence. The variation of PL peak energy did not follow the behavior predicted by Varshni formula, and a faster redshift with increasing temperature was observed. We used a model that took account of the thermal activation and thermal transfer of localized excitons to describe and explain the observed behavior. A good fitting to the experiment result is obtained. We believe the anomalous temperature dependence of PL peak energy shift can be attributed to the temperature-dependent redistribution of localized excitons induced by thermal activation and thermal transfer in the strongly localized states. V-shaped defects are thought to be a major factor causing the strong localized states in our In sub(0.153)Al sub(0.847)N sample.
ISSN:1674-4926
DOI:10.1088/1674-4926/35/9/093001