Trace analysis in EPMA

Trace element micro-analysis has evolved steadily since the early days of EPMA, yet remains an extraordinarily challenging subject. The enhanced capabilities of modern instrumentation, including the use of spectrometers with high X-ray collection efficiencies, high brightness electron sources, and i...

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Veröffentlicht in:	IOP conference series. Materials Science and Engineering 2012-01, Vol.32 (1), p.12012-22
Hauptverfasser:	Jercinovic, M J, Williams, M L, Allaz, J, Donovan, J J
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy Blanks Calibration Consistency Electron sources Error analysis Evolution Insulators Sensitivity analysis Software Spatial resolution Spectrometers Stability analysis Trace elements
Online-Zugang:	Volltext
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