Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method
Mist-atomization deposition method was applied in order to grow ZnO nanoparticles on Au-seeded glass substrates acting as seeded template. Ag doped ZnO thin films were deposited on ZnO seeded templates by solution-immersion method. The influence of Ag doping content on the optical and Raman scatteri...
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| Veröffentlicht in: | Applied Mechanics and Materials 2015-07, Vol.773-774 (International Integrated Engineering Summit 2014), p.739-743 |
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| container_issue | International Integrated Engineering Summit 2014 |
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| container_title | Applied Mechanics and Materials |
| container_volume | 773-774 |
| creator | Rusop, M. Abdullah, Nurul Afaah Asib, N.A.M. Mohamed, Ruziana Aziz, Aadila Eswar, Kevin Alvin Khusaimi, Zuraida |
| description | Mist-atomization deposition method was applied in order to grow ZnO nanoparticles on Au-seeded glass substrates acting as seeded template. Ag doped ZnO thin films were deposited on ZnO seeded templates by solution-immersion method. The influence of Ag doping content on the optical and Raman scattering properties of ZnO films were systematically investigated by UV-Vis transmittance measurement measured by ultra-violet visible spectroscopy (UV-Vis) and Raman scattering spectrum measured by Raman spectroscopy under room temperature. From UV-Vis transmittance measurement, the incorporation of Ag dopant to the ZnO makes the transmittance wavelength shifted to the shorter wavelength as compared to the pure ZnO. From Raman spectra, 4 cm-1 downshift is observed in Ag-doped thin films as compared to pure ZnO thin films. This Raman peak shift shows that a tensile stress existed in the Ag-doped ZnO film. |
| doi_str_mv | 10.4028/www.scientific.net/AMM.773-774.739 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1718971908</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3746010641</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2789-1e7fcb60f6488d9ab9cbc177cbd9d7132ba8e57d909a709cef4d171b836e21e83</originalsourceid><addsrcrecordid>eNqNkctqGzEUhodeoEmadxB0UwozkUZjXZZO3KSBGIfY3XQjNJoztsJYmkpyTR4g7x05LrR01YU4oPOfTzp8RfGF4KrBtbjY7_dVNBZcsr01lYN0MZ3PK85pyXlTcSrfFCeEsbrkjajfFueSC4qpoJOGS_butYdLSSn7UJzG-Igxa0gjTornxZis0QO6D36EkCxEpF2HHvRWO7Q0OiUI1q3RrfsFMdm1TtY75Hs0XaNZHunQD7dAq4116NoO28yBUYd83T6h1d6XywQjWvphd5grL3XMrRmMPtpX0BzSxncfi_e9HiKc_65nxffrr6urb-Xd4ub2anpXmpoLWRLgvWkZ7lkjRCd1K01rCOem7WTHCa1bLWDCO4ml5lga6JuOcNIKyqAmIOhZ8fnIHYP_ucv7qK2NBoZBO_C7qHJYSE4kPkQ__RN99Lvg8u8UYZJJyvkE59TlMWWCjzFAr8Zgtzo8KYLVwZzK5tQfcyqbU9mcyubyaVQ2lyGzIyQF7WICs_nrrf_HvABxharT</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1696937750</pqid></control><display><type>article</type><title>Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method</title><source>Scientific.net Journals</source><creator>Rusop, M. ; Abdullah, Nurul Afaah ; Asib, N.A.M. ; Mohamed, Ruziana ; Aziz, Aadila ; Eswar, Kevin Alvin ; Khusaimi, Zuraida</creator><creatorcontrib>Rusop, M. ; Abdullah, Nurul Afaah ; Asib, N.A.M. ; Mohamed, Ruziana ; Aziz, Aadila ; Eswar, Kevin Alvin ; Khusaimi, Zuraida</creatorcontrib><description>Mist-atomization deposition method was applied in order to grow ZnO nanoparticles on Au-seeded glass substrates acting as seeded template. Ag doped ZnO thin films were deposited on ZnO seeded templates by solution-immersion method. The influence of Ag doping content on the optical and Raman scattering properties of ZnO films were systematically investigated by UV-Vis transmittance measurement measured by ultra-violet visible spectroscopy (UV-Vis) and Raman scattering spectrum measured by Raman spectroscopy under room temperature. From UV-Vis transmittance measurement, the incorporation of Ag dopant to the ZnO makes the transmittance wavelength shifted to the shorter wavelength as compared to the pure ZnO. From Raman spectra, 4 cm-1 downshift is observed in Ag-doped thin films as compared to pure ZnO thin films. This Raman peak shift shows that a tensile stress existed in the Ag-doped ZnO film.</description><identifier>ISSN: 1660-9336</identifier><identifier>ISSN: 1662-7482</identifier><identifier>ISBN: 9783038354796</identifier><identifier>ISBN: 3038354791</identifier><identifier>EISSN: 1662-7482</identifier><identifier>DOI: 10.4028/www.scientific.net/AMM.773-774.739</identifier><language>eng</language><publisher>Zurich: Trans Tech Publications Ltd</publisher><subject>Deposition ; Optical properties ; Raman scattering ; Silver ; Thin films ; Transmittance ; Wavelengths ; Zinc oxide</subject><ispartof>Applied Mechanics and Materials, 2015-07, Vol.773-774 (International Integrated Engineering Summit 2014), p.739-743</ispartof><rights>2015 Abdullah et al.</rights><rights>Copyright Trans Tech Publications Ltd. Jul 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2789-1e7fcb60f6488d9ab9cbc177cbd9d7132ba8e57d909a709cef4d171b836e21e83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/4014?width=600</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Rusop, M.</creatorcontrib><creatorcontrib>Abdullah, Nurul Afaah</creatorcontrib><creatorcontrib>Asib, N.A.M.</creatorcontrib><creatorcontrib>Mohamed, Ruziana</creatorcontrib><creatorcontrib>Aziz, Aadila</creatorcontrib><creatorcontrib>Eswar, Kevin Alvin</creatorcontrib><creatorcontrib>Khusaimi, Zuraida</creatorcontrib><title>Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method</title><title>Applied Mechanics and Materials</title><description>Mist-atomization deposition method was applied in order to grow ZnO nanoparticles on Au-seeded glass substrates acting as seeded template. Ag doped ZnO thin films were deposited on ZnO seeded templates by solution-immersion method. The influence of Ag doping content on the optical and Raman scattering properties of ZnO films were systematically investigated by UV-Vis transmittance measurement measured by ultra-violet visible spectroscopy (UV-Vis) and Raman scattering spectrum measured by Raman spectroscopy under room temperature. From UV-Vis transmittance measurement, the incorporation of Ag dopant to the ZnO makes the transmittance wavelength shifted to the shorter wavelength as compared to the pure ZnO. From Raman spectra, 4 cm-1 downshift is observed in Ag-doped thin films as compared to pure ZnO thin films. This Raman peak shift shows that a tensile stress existed in the Ag-doped ZnO film.</description><subject>Deposition</subject><subject>Optical properties</subject><subject>Raman scattering</subject><subject>Silver</subject><subject>Thin films</subject><subject>Transmittance</subject><subject>Wavelengths</subject><subject>Zinc oxide</subject><issn>1660-9336</issn><issn>1662-7482</issn><issn>1662-7482</issn><isbn>9783038354796</isbn><isbn>3038354791</isbn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkctqGzEUhodeoEmadxB0UwozkUZjXZZO3KSBGIfY3XQjNJoztsJYmkpyTR4g7x05LrR01YU4oPOfTzp8RfGF4KrBtbjY7_dVNBZcsr01lYN0MZ3PK85pyXlTcSrfFCeEsbrkjajfFueSC4qpoJOGS_butYdLSSn7UJzG-Igxa0gjTornxZis0QO6D36EkCxEpF2HHvRWO7Q0OiUI1q3RrfsFMdm1TtY75Hs0XaNZHunQD7dAq4116NoO28yBUYd83T6h1d6XywQjWvphd5grL3XMrRmMPtpX0BzSxncfi_e9HiKc_65nxffrr6urb-Xd4ub2anpXmpoLWRLgvWkZ7lkjRCd1K01rCOem7WTHCa1bLWDCO4ml5lga6JuOcNIKyqAmIOhZ8fnIHYP_ucv7qK2NBoZBO_C7qHJYSE4kPkQ__RN99Lvg8u8UYZJJyvkE59TlMWWCjzFAr8Zgtzo8KYLVwZzK5tQfcyqbU9mcyubyaVQ2lyGzIyQF7WICs_nrrf_HvABxharT</recordid><startdate>20150701</startdate><enddate>20150701</enddate><creator>Rusop, M.</creator><creator>Abdullah, Nurul Afaah</creator><creator>Asib, N.A.M.</creator><creator>Mohamed, Ruziana</creator><creator>Aziz, Aadila</creator><creator>Eswar, Kevin Alvin</creator><creator>Khusaimi, Zuraida</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7TB</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BFMQW</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>KR7</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7U5</scope><scope>L7M</scope></search><sort><creationdate>20150701</creationdate><title>Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method</title><author>Rusop, M. ; Abdullah, Nurul Afaah ; Asib, N.A.M. ; Mohamed, Ruziana ; Aziz, Aadila ; Eswar, Kevin Alvin ; Khusaimi, Zuraida</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2789-1e7fcb60f6488d9ab9cbc177cbd9d7132ba8e57d909a709cef4d171b836e21e83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Deposition</topic><topic>Optical properties</topic><topic>Raman scattering</topic><topic>Silver</topic><topic>Thin films</topic><topic>Transmittance</topic><topic>Wavelengths</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rusop, M.</creatorcontrib><creatorcontrib>Abdullah, Nurul Afaah</creatorcontrib><creatorcontrib>Asib, N.A.M.</creatorcontrib><creatorcontrib>Mohamed, Ruziana</creatorcontrib><creatorcontrib>Aziz, Aadila</creatorcontrib><creatorcontrib>Eswar, Kevin Alvin</creatorcontrib><creatorcontrib>Khusaimi, Zuraida</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Continental Europe Database</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Civil Engineering Abstracts</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied Mechanics and Materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rusop, M.</au><au>Abdullah, Nurul Afaah</au><au>Asib, N.A.M.</au><au>Mohamed, Ruziana</au><au>Aziz, Aadila</au><au>Eswar, Kevin Alvin</au><au>Khusaimi, Zuraida</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method</atitle><jtitle>Applied Mechanics and Materials</jtitle><date>2015-07-01</date><risdate>2015</risdate><volume>773-774</volume><issue>International Integrated Engineering Summit 2014</issue><spage>739</spage><epage>743</epage><pages>739-743</pages><issn>1660-9336</issn><issn>1662-7482</issn><eissn>1662-7482</eissn><isbn>9783038354796</isbn><isbn>3038354791</isbn><abstract>Mist-atomization deposition method was applied in order to grow ZnO nanoparticles on Au-seeded glass substrates acting as seeded template. Ag doped ZnO thin films were deposited on ZnO seeded templates by solution-immersion method. The influence of Ag doping content on the optical and Raman scattering properties of ZnO films were systematically investigated by UV-Vis transmittance measurement measured by ultra-violet visible spectroscopy (UV-Vis) and Raman scattering spectrum measured by Raman spectroscopy under room temperature. From UV-Vis transmittance measurement, the incorporation of Ag dopant to the ZnO makes the transmittance wavelength shifted to the shorter wavelength as compared to the pure ZnO. From Raman spectra, 4 cm-1 downshift is observed in Ag-doped thin films as compared to pure ZnO thin films. This Raman peak shift shows that a tensile stress existed in the Ag-doped ZnO film.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/AMM.773-774.739</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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| subjects | Deposition Optical properties Raman scattering Silver Thin films Transmittance Wavelengths Zinc oxide |
| title | Optical Properties and Raman Scattering Investigation of Ag Doped ZnO Thin Film Prepared by Two-Step Solution-Based Deposition Method |
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