Effect of substrate temperature on the structural, morphological, and optical properties of Sb2S3 thin films
Sb2S3 thin films have been deposited by single source vacuum thermal evaporation onto glass substrates. The substrate temperature was varied in the range of 25–270°C. X-ray diffraction (XRD) showed that films deposited at substrate TS
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| Veröffentlicht in: | Applied surface science 2015-09, Vol.350, p.19-24 |
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| creator | Aousgi, F. Dimassi, W. Bessais, B. Kanzari, M. |
| description | Sb2S3 thin films have been deposited by single source vacuum thermal evaporation onto glass substrates. The substrate temperature was varied in the range of 25–270°C. X-ray diffraction (XRD) showed that films deposited at substrate TS |
| doi_str_mv | 10.1016/j.apsusc.2015.01.126 |
| format | Article |
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The substrate temperature was varied in the range of 25–270°C. X-ray diffraction (XRD) showed that films deposited at substrate TS<250°C have an amorphous structure, while those prepared at TS≥250°C have a polycrystalline structure. XRD investigations showed that the crystallite size dimension increases with increasing substrate temperature. The effect of substrate temperature on grain size and surface roughness was studied by atomic force microscopy (AFM). The optical constants of the films were determined from optical transmission recorded in the 500–1800nm wavelength range. The dispersion parameters and the high-frequency dielectric constant were determined by modeling the refractive index using the Wemple–Di Domenico model. The optical band gap energy of the films decreases from 1.98 to 1.74eV as the substrate temperature varies from 25 to 270°C.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2015.01.126</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Atomic force microscopy ; Constants ; Crystallites ; Deposition ; Dispersions ; Glass ; Glasses ; Sb2S3 ; Surface morphology ; Thin films ; Vacuum deposition ; X-ray diffraction</subject><ispartof>Applied surface science, 2015-09, Vol.350, p.19-24</ispartof><rights>2015 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c339t-2f1249ffb6ad37105f7cd1430f3e82806f45a3bd1947ebb3c288007e998728293</citedby><cites>FETCH-LOGICAL-c339t-2f1249ffb6ad37105f7cd1430f3e82806f45a3bd1947ebb3c288007e998728293</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0169433215001518$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Aousgi, F.</creatorcontrib><creatorcontrib>Dimassi, W.</creatorcontrib><creatorcontrib>Bessais, B.</creatorcontrib><creatorcontrib>Kanzari, M.</creatorcontrib><title>Effect of substrate temperature on the structural, morphological, and optical properties of Sb2S3 thin films</title><title>Applied surface science</title><description>Sb2S3 thin films have been deposited by single source vacuum thermal evaporation onto glass substrates. The substrate temperature was varied in the range of 25–270°C. X-ray diffraction (XRD) showed that films deposited at substrate TS<250°C have an amorphous structure, while those prepared at TS≥250°C have a polycrystalline structure. XRD investigations showed that the crystallite size dimension increases with increasing substrate temperature. The effect of substrate temperature on grain size and surface roughness was studied by atomic force microscopy (AFM). The optical constants of the films were determined from optical transmission recorded in the 500–1800nm wavelength range. The dispersion parameters and the high-frequency dielectric constant were determined by modeling the refractive index using the Wemple–Di Domenico model. The optical band gap energy of the films decreases from 1.98 to 1.74eV as the substrate temperature varies from 25 to 270°C.</description><subject>Atomic force microscopy</subject><subject>Constants</subject><subject>Crystallites</subject><subject>Deposition</subject><subject>Dispersions</subject><subject>Glass</subject><subject>Glasses</subject><subject>Sb2S3</subject><subject>Surface morphology</subject><subject>Thin films</subject><subject>Vacuum deposition</subject><subject>X-ray diffraction</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouK7-Aw85erA1H-02vQiy-AULHlbPIU0nbpa2qUkq-O9NqWdPM5N535fJg9A1JTkldHN3zNUYpqBzRmiZE5pTtjlBKyoqnpWlKE7RKsnqrOCcnaOLEI6EUJa2K9Q9GgM6YmdwmJoQvYqAI_QjpG7ygN2A4wFw2kw6PajuFvfOjwfXuU-r51ENLXZjnAc8epec0UKYE_cN2_NktwM2tuvDJTozqgtw9VfX6OPp8X37ku3enl-3D7tMc17HjBnKitqYZqNaXlFSmkq3tODEcBBMkI0pSsWbltZFBU3DNROCkArqWlRMsJqv0c2Sm875miBE2dugoevUAG4KklZU1GUhyllaLFLtXQgejBy97ZX_kZTIGa48ygWunOFKQmWCm2z3iw3SN74teBm0hUFDa33CKVtn_w_4BbFnhYw</recordid><startdate>20150930</startdate><enddate>20150930</enddate><creator>Aousgi, F.</creator><creator>Dimassi, W.</creator><creator>Bessais, B.</creator><creator>Kanzari, M.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20150930</creationdate><title>Effect of substrate temperature on the structural, morphological, and optical properties of Sb2S3 thin films</title><author>Aousgi, F. ; Dimassi, W. ; Bessais, B. ; Kanzari, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c339t-2f1249ffb6ad37105f7cd1430f3e82806f45a3bd1947ebb3c288007e998728293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Atomic force microscopy</topic><topic>Constants</topic><topic>Crystallites</topic><topic>Deposition</topic><topic>Dispersions</topic><topic>Glass</topic><topic>Glasses</topic><topic>Sb2S3</topic><topic>Surface morphology</topic><topic>Thin films</topic><topic>Vacuum deposition</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aousgi, F.</creatorcontrib><creatorcontrib>Dimassi, W.</creatorcontrib><creatorcontrib>Bessais, B.</creatorcontrib><creatorcontrib>Kanzari, M.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aousgi, F.</au><au>Dimassi, W.</au><au>Bessais, B.</au><au>Kanzari, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of substrate temperature on the structural, morphological, and optical properties of Sb2S3 thin films</atitle><jtitle>Applied surface science</jtitle><date>2015-09-30</date><risdate>2015</risdate><volume>350</volume><spage>19</spage><epage>24</epage><pages>19-24</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>Sb2S3 thin films have been deposited by single source vacuum thermal evaporation onto glass substrates. The substrate temperature was varied in the range of 25–270°C. X-ray diffraction (XRD) showed that films deposited at substrate TS<250°C have an amorphous structure, while those prepared at TS≥250°C have a polycrystalline structure. XRD investigations showed that the crystallite size dimension increases with increasing substrate temperature. The effect of substrate temperature on grain size and surface roughness was studied by atomic force microscopy (AFM). The optical constants of the films were determined from optical transmission recorded in the 500–1800nm wavelength range. The dispersion parameters and the high-frequency dielectric constant were determined by modeling the refractive index using the Wemple–Di Domenico model. The optical band gap energy of the films decreases from 1.98 to 1.74eV as the substrate temperature varies from 25 to 270°C.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2015.01.126</doi><tpages>6</tpages></addata></record> |
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| source | Elsevier ScienceDirect Journals |
| subjects | Atomic force microscopy Constants Crystallites Deposition Dispersions Glass Glasses Sb2S3 Surface morphology Thin films Vacuum deposition X-ray diffraction |
| title | Effect of substrate temperature on the structural, morphological, and optical properties of Sb2S3 thin films |
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