Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder

•Ni75Fe25 permalloy (Py) thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si(111) substrate.•The texture was found to change with increasing thickness.•The existence of nanosized grains with a uniform distribution has been observed.•The exis...

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Veröffentlicht in:Applied surface science 2015-09, Vol.350, p.50-56
Hauptverfasser: Kaibi, A., Guittoum, A., Öksüzoğlu, R.M., Yağci, A.M., Boudissa, M., Kechouane, M.
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container_end_page 56
container_issue
container_start_page 50
container_title Applied surface science
container_volume 350
creator Kaibi, A.
Guittoum, A.
Öksüzoğlu, R.M.
Yağci, A.M.
Boudissa, M.
Kechouane, M.
description •Ni75Fe25 permalloy (Py) thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si(111) substrate.•The texture was found to change with increasing thickness.•The existence of nanosized grains with a uniform distribution has been observed.•The existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane has been evidenced.•The coercive field was found to decrease with increasing thickness. We report on the structural, microstructural and magnetic properties of Ni75Fe25 permalloy (Py) thin films. Py thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si (11) substrate. The thickness varies from 16nm to 250nm. From grazing X-ray diffraction patterns (GIXRD), we have shown the presence of a strong 〈200〉 texture for the lowest thickness (16nm). For the 52nm and 84nm thick samples, a strong 〈111〉 preferred orientation is developed. However, for higher thicknesses, a polycrystalline structure is present. From the Scanning Electron Microscopy observations (SEM), we have shown that the surface seems to be very dense with many fine grains. The analysis of EDX spectra revealed that the sample composition is close to the starting Ni75Fe25 powder. A more accurate investigation of the morphology was performed with the atomic force microscopy (AFM). We have shown the existence of nanosized grains with a uniform distribution. The mean diameter of the grains increases from 27nm to 40nm when the thickness increases. From magnetic measurements, we have shown the existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane. The coercive field, HC was found to decrease with increasing thickness.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1718951497</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0169433215003451</els_id><sourcerecordid>1718951497</sourcerecordid><originalsourceid>FETCH-LOGICAL-c269t-d50ee6204066b11f70e7e3e274ebaa1dd4c1037c2f219cacc539401cf05cde853</originalsourceid><addsrcrecordid>eNp9kE9LxDAUxIMouK5-Aw85erD1JW365yLI4qogelDPIU1eJUvb1KRd3W9vlyrePD2GNzMwP0LOGcQMWHa1iVUfxqBjDkzEwGMQcEAWrMiTSIgiPSSLyVZGaZLwY3ISwgaA8em7IF8vgx_1MHq8pK3V3oVfTVVnaKveOxyspr13PfrBYqCupk82F2vkgta2aQPFRlXOqwENrXYUt6rfK-s6WnvX0k51f7WG9u7ToD8lR7VqAp793CV5W9--ru6jx-e7h9XNY6R5Vg6REYCYcUghyyrG6hwwxwR5nmKlFDMm1QySXPOas1IrrUVSpsB0DUIbLESyJBdz77TgY8QwyNYGjU2jOnRjkCxnRSlYWuaTNZ2tewzBYy17b1vld5KB3IOWGzmDlnvQEricQE-x6zmG04ytRS-DtthpNNajHqRx9v-Cb4-Ei8U</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1718951497</pqid></control><display><type>article</type><title>Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder</title><source>Access via ScienceDirect (Elsevier)</source><creator>Kaibi, A. ; Guittoum, A. ; Öksüzoğlu, R.M. ; Yağci, A.M. ; Boudissa, M. ; Kechouane, M.</creator><creatorcontrib>Kaibi, A. ; Guittoum, A. ; Öksüzoğlu, R.M. ; Yağci, A.M. ; Boudissa, M. ; Kechouane, M.</creatorcontrib><description>•Ni75Fe25 permalloy (Py) thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si(111) substrate.•The texture was found to change with increasing thickness.•The existence of nanosized grains with a uniform distribution has been observed.•The existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane has been evidenced.•The coercive field was found to decrease with increasing thickness. We report on the structural, microstructural and magnetic properties of Ni75Fe25 permalloy (Py) thin films. Py thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si (11) substrate. The thickness varies from 16nm to 250nm. From grazing X-ray diffraction patterns (GIXRD), we have shown the presence of a strong 〈200〉 texture for the lowest thickness (16nm). For the 52nm and 84nm thick samples, a strong 〈111〉 preferred orientation is developed. However, for higher thicknesses, a polycrystalline structure is present. From the Scanning Electron Microscopy observations (SEM), we have shown that the surface seems to be very dense with many fine grains. The analysis of EDX spectra revealed that the sample composition is close to the starting Ni75Fe25 powder. A more accurate investigation of the morphology was performed with the atomic force microscopy (AFM). We have shown the existence of nanosized grains with a uniform distribution. The mean diameter of the grains increases from 27nm to 40nm when the thickness increases. From magnetic measurements, we have shown the existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane. The coercive field, HC was found to decrease with increasing thickness.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2015.02.050</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>AFM ; Ferrous alloys ; Grains ; Magnetic properties ; Microstructure ; Nanostructure ; Ni75Fe25 films ; Nickel base alloys ; Scanning electron microscopy ; Silicon substrates ; Texture ; Thin films ; X-ray diffraction</subject><ispartof>Applied surface science, 2015-09, Vol.350, p.50-56</ispartof><rights>2015 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c269t-d50ee6204066b11f70e7e3e274ebaa1dd4c1037c2f219cacc539401cf05cde853</citedby><cites>FETCH-LOGICAL-c269t-d50ee6204066b11f70e7e3e274ebaa1dd4c1037c2f219cacc539401cf05cde853</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2015.02.050$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Kaibi, A.</creatorcontrib><creatorcontrib>Guittoum, A.</creatorcontrib><creatorcontrib>Öksüzoğlu, R.M.</creatorcontrib><creatorcontrib>Yağci, A.M.</creatorcontrib><creatorcontrib>Boudissa, M.</creatorcontrib><creatorcontrib>Kechouane, M.</creatorcontrib><title>Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder</title><title>Applied surface science</title><description>•Ni75Fe25 permalloy (Py) thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si(111) substrate.•The texture was found to change with increasing thickness.•The existence of nanosized grains with a uniform distribution has been observed.•The existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane has been evidenced.•The coercive field was found to decrease with increasing thickness. We report on the structural, microstructural and magnetic properties of Ni75Fe25 permalloy (Py) thin films. Py thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si (11) substrate. The thickness varies from 16nm to 250nm. From grazing X-ray diffraction patterns (GIXRD), we have shown the presence of a strong 〈200〉 texture for the lowest thickness (16nm). For the 52nm and 84nm thick samples, a strong 〈111〉 preferred orientation is developed. However, for higher thicknesses, a polycrystalline structure is present. From the Scanning Electron Microscopy observations (SEM), we have shown that the surface seems to be very dense with many fine grains. The analysis of EDX spectra revealed that the sample composition is close to the starting Ni75Fe25 powder. A more accurate investigation of the morphology was performed with the atomic force microscopy (AFM). We have shown the existence of nanosized grains with a uniform distribution. The mean diameter of the grains increases from 27nm to 40nm when the thickness increases. From magnetic measurements, we have shown the existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane. The coercive field, HC was found to decrease with increasing thickness.</description><subject>AFM</subject><subject>Ferrous alloys</subject><subject>Grains</subject><subject>Magnetic properties</subject><subject>Microstructure</subject><subject>Nanostructure</subject><subject>Ni75Fe25 films</subject><subject>Nickel base alloys</subject><subject>Scanning electron microscopy</subject><subject>Silicon substrates</subject><subject>Texture</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp9kE9LxDAUxIMouK5-Aw85erD1JW365yLI4qogelDPIU1eJUvb1KRd3W9vlyrePD2GNzMwP0LOGcQMWHa1iVUfxqBjDkzEwGMQcEAWrMiTSIgiPSSLyVZGaZLwY3ISwgaA8em7IF8vgx_1MHq8pK3V3oVfTVVnaKveOxyspr13PfrBYqCupk82F2vkgta2aQPFRlXOqwENrXYUt6rfK-s6WnvX0k51f7WG9u7ToD8lR7VqAp793CV5W9--ru6jx-e7h9XNY6R5Vg6REYCYcUghyyrG6hwwxwR5nmKlFDMm1QySXPOas1IrrUVSpsB0DUIbLESyJBdz77TgY8QwyNYGjU2jOnRjkCxnRSlYWuaTNZ2tewzBYy17b1vld5KB3IOWGzmDlnvQEricQE-x6zmG04ytRS-DtthpNNajHqRx9v-Cb4-Ei8U</recordid><startdate>20150930</startdate><enddate>20150930</enddate><creator>Kaibi, A.</creator><creator>Guittoum, A.</creator><creator>Öksüzoğlu, R.M.</creator><creator>Yağci, A.M.</creator><creator>Boudissa, M.</creator><creator>Kechouane, M.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20150930</creationdate><title>Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder</title><author>Kaibi, A. ; Guittoum, A. ; Öksüzoğlu, R.M. ; Yağci, A.M. ; Boudissa, M. ; Kechouane, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c269t-d50ee6204066b11f70e7e3e274ebaa1dd4c1037c2f219cacc539401cf05cde853</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>AFM</topic><topic>Ferrous alloys</topic><topic>Grains</topic><topic>Magnetic properties</topic><topic>Microstructure</topic><topic>Nanostructure</topic><topic>Ni75Fe25 films</topic><topic>Nickel base alloys</topic><topic>Scanning electron microscopy</topic><topic>Silicon substrates</topic><topic>Texture</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kaibi, A.</creatorcontrib><creatorcontrib>Guittoum, A.</creatorcontrib><creatorcontrib>Öksüzoğlu, R.M.</creatorcontrib><creatorcontrib>Yağci, A.M.</creatorcontrib><creatorcontrib>Boudissa, M.</creatorcontrib><creatorcontrib>Kechouane, M.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kaibi, A.</au><au>Guittoum, A.</au><au>Öksüzoğlu, R.M.</au><au>Yağci, A.M.</au><au>Boudissa, M.</au><au>Kechouane, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder</atitle><jtitle>Applied surface science</jtitle><date>2015-09-30</date><risdate>2015</risdate><volume>350</volume><spage>50</spage><epage>56</epage><pages>50-56</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>•Ni75Fe25 permalloy (Py) thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si(111) substrate.•The texture was found to change with increasing thickness.•The existence of nanosized grains with a uniform distribution has been observed.•The existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane has been evidenced.•The coercive field was found to decrease with increasing thickness. We report on the structural, microstructural and magnetic properties of Ni75Fe25 permalloy (Py) thin films. Py thin films with different thicknesses were deposited by vacuum evaporation from nanocrystalline powder onto Si (11) substrate. The thickness varies from 16nm to 250nm. From grazing X-ray diffraction patterns (GIXRD), we have shown the presence of a strong 〈200〉 texture for the lowest thickness (16nm). For the 52nm and 84nm thick samples, a strong 〈111〉 preferred orientation is developed. However, for higher thicknesses, a polycrystalline structure is present. From the Scanning Electron Microscopy observations (SEM), we have shown that the surface seems to be very dense with many fine grains. The analysis of EDX spectra revealed that the sample composition is close to the starting Ni75Fe25 powder. A more accurate investigation of the morphology was performed with the atomic force microscopy (AFM). We have shown the existence of nanosized grains with a uniform distribution. The mean diameter of the grains increases from 27nm to 40nm when the thickness increases. From magnetic measurements, we have shown the existence of a uniaxial magnetic anisotropy with an easy axis parallel to the film plane. The coercive field, HC was found to decrease with increasing thickness.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2015.02.050</doi><tpages>7</tpages></addata></record>
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subjects AFM
Ferrous alloys
Grains
Magnetic properties
Microstructure
Nanostructure
Ni75Fe25 films
Nickel base alloys
Scanning electron microscopy
Silicon substrates
Texture
Thin films
X-ray diffraction
title Structure, microstructure and magnetic properties of Ni75Fe25 films elaborated by evaporation from nanostructured powder
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T13%3A21%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structure,%20microstructure%20and%20magnetic%20properties%20of%20Ni75Fe25%20films%20elaborated%20by%20evaporation%20from%20nanostructured%20powder&rft.jtitle=Applied%20surface%20science&rft.au=Kaibi,%20A.&rft.date=2015-09-30&rft.volume=350&rft.spage=50&rft.epage=56&rft.pages=50-56&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/j.apsusc.2015.02.050&rft_dat=%3Cproquest_cross%3E1718951497%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1718951497&rft_id=info:pmid/&rft_els_id=S0169433215003451&rfr_iscdi=true