Observation of an Orientation Change in Highly Oriented Layer-by-Layer Films of a Ruthenium Complex upon Oxidation Reaction

Layer-by-layer films composed of redox-active ruthenium dimer and Zr­(IV) ions were fabricated on an indium tin oxide electrode. The fabricating behavior was monitored by cyclic voltammetry and UV–vis absorption spectral measurements. The orientation of the film was also monitored by grazing-incidence small-angle and wide-angle X-ray scattering (GISAXS) measurements, and it has been clarified that this film has a crystalline structure. The peaks obtained by GISAXS were changed upon oxidation reaction, which indicates that a change in the orientation of the ruthenium dimer occurred in the film.