Analysis of traction‐free assumption in high‐resolution EBSD measurements

Summary The effects of using a traction‐free (plane‐stress) assumption to obtain the full distortion tensor from high‐resolution EBSD measurements are analyzed. Equations are derived which bound the traction‐free error arising from angular misorientation of the sample surface; the error in recovered...

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Veröffentlicht in:	Journal of microscopy (Oxford) 2015-10, Vol.260 (1), p.73-85
Hauptverfasser:	HARDIN, T.J., RUGGLES, T.J., KOCH, D.P., NIEZGODA, S.R., FULLWOOD, D.T., HOMER, E.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	HR‐EBSD lattice distortion traction‐free
Online-Zugang:	Volltext
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