Mapping the domain wall pinning profile by stochastic imaging reconstruction

Polar magneto-optical Kerr effect microscopy and subsequent stochastic imaging reconstruction have been used to map out the distinct pinning profiles of randomly distributed intrinsic defects (pointlike/linelike), as well as their dependence on the external magnetic field in 2- mu m-thick yttrium ir...

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Veröffentlicht in:	Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2013-01, Vol.87 (1), Article 014427
Hauptverfasser:	Jiang, Wanjun, Fan, Yabin, Upadhyaya, Pramey, Lang, Murong, Wang, Minsheng, Chang, Li-Te, Wong, Kin L., Tang, Jianshi, Lewis, Mark, Zhao, Jing, He, Liang, Kou, Xufeng, Zeng, Caifu, Zhou, X. Z., Schwartz, Robert N., Wang, Kang L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter Defects Domain walls Imaging Lithography Pinning Reconstruction Stochasticity
Online-Zugang:	Volltext
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