Impedance spectroscopy: A method for determining the degree of intermixing in stacks of organic semiconductors

One of the main difficulties occurring in printed organic electronics is the intermixing between adjacent layers. This has to be quantified to optimise printed devices. Methods like sputter X‐ray photoelectron spectroscopy (XPS) are suitable for this, but also complex, expensive and destructive. We...

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Veröffentlicht in:	Physica Status Solidi. B: Basic Solid State Physics 2015-06, Vol.252 (6), p.1272-1279
Hauptverfasser:	Tone, Robert, Bornemann, Nils, Mechau, Norman, Dörsam, Edgar
Format:	Artikel
Sprache:	eng
Schlagworte:	Deviation Devices Double layer Impedance spectroscopy intermixing at interfaces printed organic electronics Simplification Solid state physics Spectra wet processing X-ray photoelectron spectroscopy
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