Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films

The deposition of undoped, aluminum and/or holmium doped and co-doped zinc oxide thin films on different substrates was achieved using a very simple and versatile aqueous solution method. The effect of the precursor solution concentration on the morphological and structural characteristics, as well...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Ceramics international 2013-07, Vol.39 (5), p.5535-5543
Hauptverfasser: Mereu, R.A., Mesaros, A., Vasilescu, M., Popa, M., Gabor, M.S., Ciontea, L., Petrisor, T.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5543
container_issue 5
container_start_page 5535
container_title Ceramics international
container_volume 39
creator Mereu, R.A.
Mesaros, A.
Vasilescu, M.
Popa, M.
Gabor, M.S.
Ciontea, L.
Petrisor, T.
description The deposition of undoped, aluminum and/or holmium doped and co-doped zinc oxide thin films on different substrates was achieved using a very simple and versatile aqueous solution method. The effect of the precursor solution concentration on the morphological and structural characteristics, as well as on the optical properties of the undoped ZnO thin films was also investigated. The AFM investigations have revealed that the morphology of the films is smooth and homogeneous. The room-temperature photoluminescence (PL) and the optical absorption (UV–vis) properties of the as-obtained undoped and doped ZnO thin films were investigated, as well. A strong UV emission (380nm) was recorded for the undoped, aluminum and holmium doped and co-doped ZnO thin films. The band gap value obtained for the doped ZnO thin films is ranging between 3.01eV and 3.56eV, depending on the nature and the concentration of the dopant.
doi_str_mv 10.1016/j.ceramint.2012.12.067
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1692318030</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0272884212014289</els_id><sourcerecordid>1692318030</sourcerecordid><originalsourceid>FETCH-LOGICAL-c378t-77ed67c29055ec84ec873bbc61d11fe4bec6b42934a3b341bca25bc9064ad48f3</originalsourceid><addsrcrecordid>eNqFkEtLAzEUhYMoWB9_QbJ04UzzmmRmZxFfUOhC3bgJmcwdmjJNajIV9NebWl0X7uXC5ZwD50PoipKSEiqnq9JCNGvnx5IRyso8RKojNKG14gVvKnmMJoQpVtS1YKfoLKUVycZGkAmav3z5cQnJJWx8h-3SRGNHiO7bjC54HHq89V3YQHeDZ8NOMw0RPwX8-8PvfoHHpfP4wQ3rdIFOejMkuPy75-jt4f717qmYLx6f72bzwnJVj4VS0EllWUOqCmwt8iretlbSjtIeRAtWtoI1XBjeckFba1jV2oZIYTpR9_wcXe9zNzF8bCGNeu2ShWEwHsI26dyNcVoTTg5LuWKyqgURWSr3UhtDShF6vYlubeKXpkTvSOuV_ietd6R1nkw6G2_3RsidPx1EnawDb6FzEeyou-AORfwAKomJ9A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1372658404</pqid></control><display><type>article</type><title>Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Mereu, R.A. ; Mesaros, A. ; Vasilescu, M. ; Popa, M. ; Gabor, M.S. ; Ciontea, L. ; Petrisor, T.</creator><creatorcontrib>Mereu, R.A. ; Mesaros, A. ; Vasilescu, M. ; Popa, M. ; Gabor, M.S. ; Ciontea, L. ; Petrisor, T.</creatorcontrib><description>The deposition of undoped, aluminum and/or holmium doped and co-doped zinc oxide thin films on different substrates was achieved using a very simple and versatile aqueous solution method. The effect of the precursor solution concentration on the morphological and structural characteristics, as well as on the optical properties of the undoped ZnO thin films was also investigated. The AFM investigations have revealed that the morphology of the films is smooth and homogeneous. The room-temperature photoluminescence (PL) and the optical absorption (UV–vis) properties of the as-obtained undoped and doped ZnO thin films were investigated, as well. A strong UV emission (380nm) was recorded for the undoped, aluminum and holmium doped and co-doped ZnO thin films. The band gap value obtained for the doped ZnO thin films is ranging between 3.01eV and 3.56eV, depending on the nature and the concentration of the dopant.</description><identifier>ISSN: 0272-8842</identifier><identifier>EISSN: 1873-3956</identifier><identifier>DOI: 10.1016/j.ceramint.2012.12.067</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Aluminium ; Aluminum ; Aqueous solution deposition ; C. Optical properties ; Ceramics ; Deposition ; Holmium ; Luminescence ; Optical properties ; Thin films ; Zinc oxide</subject><ispartof>Ceramics international, 2013-07, Vol.39 (5), p.5535-5543</ispartof><rights>2013 Elsevier Ltd and Techna Group S.r.l.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c378t-77ed67c29055ec84ec873bbc61d11fe4bec6b42934a3b341bca25bc9064ad48f3</citedby><cites>FETCH-LOGICAL-c378t-77ed67c29055ec84ec873bbc61d11fe4bec6b42934a3b341bca25bc9064ad48f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ceramint.2012.12.067$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,46000</link.rule.ids></links><search><creatorcontrib>Mereu, R.A.</creatorcontrib><creatorcontrib>Mesaros, A.</creatorcontrib><creatorcontrib>Vasilescu, M.</creatorcontrib><creatorcontrib>Popa, M.</creatorcontrib><creatorcontrib>Gabor, M.S.</creatorcontrib><creatorcontrib>Ciontea, L.</creatorcontrib><creatorcontrib>Petrisor, T.</creatorcontrib><title>Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films</title><title>Ceramics international</title><description>The deposition of undoped, aluminum and/or holmium doped and co-doped zinc oxide thin films on different substrates was achieved using a very simple and versatile aqueous solution method. The effect of the precursor solution concentration on the morphological and structural characteristics, as well as on the optical properties of the undoped ZnO thin films was also investigated. The AFM investigations have revealed that the morphology of the films is smooth and homogeneous. The room-temperature photoluminescence (PL) and the optical absorption (UV–vis) properties of the as-obtained undoped and doped ZnO thin films were investigated, as well. A strong UV emission (380nm) was recorded for the undoped, aluminum and holmium doped and co-doped ZnO thin films. The band gap value obtained for the doped ZnO thin films is ranging between 3.01eV and 3.56eV, depending on the nature and the concentration of the dopant.</description><subject>Aluminium</subject><subject>Aluminum</subject><subject>Aqueous solution deposition</subject><subject>C. Optical properties</subject><subject>Ceramics</subject><subject>Deposition</subject><subject>Holmium</subject><subject>Luminescence</subject><subject>Optical properties</subject><subject>Thin films</subject><subject>Zinc oxide</subject><issn>0272-8842</issn><issn>1873-3956</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkEtLAzEUhYMoWB9_QbJ04UzzmmRmZxFfUOhC3bgJmcwdmjJNajIV9NebWl0X7uXC5ZwD50PoipKSEiqnq9JCNGvnx5IRyso8RKojNKG14gVvKnmMJoQpVtS1YKfoLKUVycZGkAmav3z5cQnJJWx8h-3SRGNHiO7bjC54HHq89V3YQHeDZ8NOMw0RPwX8-8PvfoHHpfP4wQ3rdIFOejMkuPy75-jt4f717qmYLx6f72bzwnJVj4VS0EllWUOqCmwt8iretlbSjtIeRAtWtoI1XBjeckFba1jV2oZIYTpR9_wcXe9zNzF8bCGNeu2ShWEwHsI26dyNcVoTTg5LuWKyqgURWSr3UhtDShF6vYlubeKXpkTvSOuV_ietd6R1nkw6G2_3RsidPx1EnawDb6FzEeyou-AORfwAKomJ9A</recordid><startdate>20130701</startdate><enddate>20130701</enddate><creator>Mereu, R.A.</creator><creator>Mesaros, A.</creator><creator>Vasilescu, M.</creator><creator>Popa, M.</creator><creator>Gabor, M.S.</creator><creator>Ciontea, L.</creator><creator>Petrisor, T.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20130701</creationdate><title>Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films</title><author>Mereu, R.A. ; Mesaros, A. ; Vasilescu, M. ; Popa, M. ; Gabor, M.S. ; Ciontea, L. ; Petrisor, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c378t-77ed67c29055ec84ec873bbc61d11fe4bec6b42934a3b341bca25bc9064ad48f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Aluminium</topic><topic>Aluminum</topic><topic>Aqueous solution deposition</topic><topic>C. Optical properties</topic><topic>Ceramics</topic><topic>Deposition</topic><topic>Holmium</topic><topic>Luminescence</topic><topic>Optical properties</topic><topic>Thin films</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mereu, R.A.</creatorcontrib><creatorcontrib>Mesaros, A.</creatorcontrib><creatorcontrib>Vasilescu, M.</creatorcontrib><creatorcontrib>Popa, M.</creatorcontrib><creatorcontrib>Gabor, M.S.</creatorcontrib><creatorcontrib>Ciontea, L.</creatorcontrib><creatorcontrib>Petrisor, T.</creatorcontrib><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Ceramics international</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mereu, R.A.</au><au>Mesaros, A.</au><au>Vasilescu, M.</au><au>Popa, M.</au><au>Gabor, M.S.</au><au>Ciontea, L.</au><au>Petrisor, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films</atitle><jtitle>Ceramics international</jtitle><date>2013-07-01</date><risdate>2013</risdate><volume>39</volume><issue>5</issue><spage>5535</spage><epage>5543</epage><pages>5535-5543</pages><issn>0272-8842</issn><eissn>1873-3956</eissn><abstract>The deposition of undoped, aluminum and/or holmium doped and co-doped zinc oxide thin films on different substrates was achieved using a very simple and versatile aqueous solution method. The effect of the precursor solution concentration on the morphological and structural characteristics, as well as on the optical properties of the undoped ZnO thin films was also investigated. The AFM investigations have revealed that the morphology of the films is smooth and homogeneous. The room-temperature photoluminescence (PL) and the optical absorption (UV–vis) properties of the as-obtained undoped and doped ZnO thin films were investigated, as well. A strong UV emission (380nm) was recorded for the undoped, aluminum and holmium doped and co-doped ZnO thin films. The band gap value obtained for the doped ZnO thin films is ranging between 3.01eV and 3.56eV, depending on the nature and the concentration of the dopant.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.ceramint.2012.12.067</doi><tpages>9</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0272-8842
ispartof Ceramics international, 2013-07, Vol.39 (5), p.5535-5543
issn 0272-8842
1873-3956
language eng
recordid cdi_proquest_miscellaneous_1692318030
source Elsevier ScienceDirect Journals Complete
subjects Aluminium
Aluminum
Aqueous solution deposition
C. Optical properties
Ceramics
Deposition
Holmium
Luminescence
Optical properties
Thin films
Zinc oxide
title Synthesis and characterization of undoped, Al and/or Ho doped ZnO thin Films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-14T03%3A08%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Synthesis%20and%20characterization%20of%20undoped,%20Al%20and/or%20Ho%20doped%20ZnO%20thin%20Films&rft.jtitle=Ceramics%20international&rft.au=Mereu,%20R.A.&rft.date=2013-07-01&rft.volume=39&rft.issue=5&rft.spage=5535&rft.epage=5543&rft.pages=5535-5543&rft.issn=0272-8842&rft.eissn=1873-3956&rft_id=info:doi/10.1016/j.ceramint.2012.12.067&rft_dat=%3Cproquest_cross%3E1692318030%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1372658404&rft_id=info:pmid/&rft_els_id=S0272884212014289&rfr_iscdi=true